{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T04:26:56Z","timestamp":1770784016939,"version":"3.50.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/essderc.2012.6343336","type":"proceedings-article","created":{"date-parts":[[2012,11,15]],"date-time":"2012-11-15T12:06:42Z","timestamp":1352981202000},"page":"73-76","source":"Crossref","is-referenced-by-count":11,"title":["Study of carrier transport in strained and unstrained SOI tri-gate and omega-gate Si-nanowire MOSFETs"],"prefix":"10.1109","author":[{"given":"M.","family":"Koyama","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Casse","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Coquand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Barraud","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Iwai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Ghibaudo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Reimbold","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"crossref","first-page":"1438","DOI":"10.1109\/TED.2007.896372","volume":"54","author":"teramoto","year":"2007","journal-title":"IEEE TED"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2210627"},{"key":"13","first-page":"225","author":"irie","year":"2004","journal-title":"IEDM Tech Dig"},{"key":"14","doi-asserted-by":"crossref","first-page":"367","DOI":"10.1109\/TED.2005.843894","volume":"52","author":"mizuno","year":"2005","journal-title":"IEEE TED"},{"key":"11","doi-asserted-by":"crossref","first-page":"84501","DOI":"10.1063\/1.2795649","volume":"102","author":"sun","year":"2007","journal-title":"J Appl Phys"},{"key":"12","volume":"2005","author":"uchida","year":"2006","journal-title":"IEDM Tech Dig"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2008.4588552"},{"key":"2","doi-asserted-by":"crossref","first-page":"93716","DOI":"10.1063\/1.3488635","volume":"108","author":"baykan","year":"2010","journal-title":"J Appl Phys"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1038\/nature10676"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0552-9"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/16.337449"},{"key":"6","author":"coquand","year":"2012","journal-title":"Proc ULIS Conf"},{"key":"5","author":"coquand","year":"2012","journal-title":"Symp VLSI Tech"},{"key":"4","first-page":"21","volume":"21","author":"liu","year":"2005","journal-title":"IEEE Circ and Dev Mag"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1585120"},{"key":"8","first-page":"3441","author":"tachi","year":"2010","journal-title":"IEDM Tech Dig"}],"event":{"name":"ESSDERC 2012 - 42nd European Solid State Device Research Conference","location":"Bordeaux, France","start":{"date-parts":[[2012,9,17]]},"end":{"date-parts":[[2012,9,21]]}},"container-title":["2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6331298\/6343319\/06343336.pdf?arnumber=6343336","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T22:43:03Z","timestamp":1497998583000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6343336\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/essderc.2012.6343336","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}