{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:59:28Z","timestamp":1729634368290,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/essderc.2013.6818844","type":"proceedings-article","created":{"date-parts":[[2014,5,30]],"date-time":"2014-05-30T18:34:21Z","timestamp":1401474861000},"page":"163-165","source":"Crossref","is-referenced-by-count":2,"title":["Connecting RRAM performance to the properties of the hafnia-based dielectrics"],"prefix":"10.1109","author":[{"given":"Gennadi","family":"Bersuker","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Brian","family":"Butcher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Gilmer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul","family":"Kirsch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Larcher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Padovani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1002\/9783527635566.ch1"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2023"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1166\/jnn.2012.6650"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2255104"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4765342"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2158825"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1063\/1.3671565"},{"key":"9","doi-asserted-by":"crossref","first-page":"750","DOI":"10.1109\/LED.2013.2256101","article-title":"Leakage current - Forming voltage relation and oxygen gettering in HfOx RRAM Devices","volume":"34","author":"young-fisher","year":"0","journal-title":"IEEE Electron Device Letters"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2013.6582096"}],"event":{"name":"ESSDERC 2013 - 43rd European Solid State Device Research Conference","start":{"date-parts":[[2013,9,16]]},"location":"Bucharest, Romania","end":{"date-parts":[[2013,9,20]]}},"container-title":["2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6811819\/6818804\/06818844.pdf?arnumber=6818844","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T14:07:28Z","timestamp":1498140448000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6818844\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/essderc.2013.6818844","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}