{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:07:58Z","timestamp":1725782878787},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/essderc.2013.6818863","type":"proceedings-article","created":{"date-parts":[[2014,5,30]],"date-time":"2014-05-30T18:34:21Z","timestamp":1401474861000},"page":"238-241","source":"Crossref","is-referenced-by-count":6,"title":["Flicker noise in advanced CMOS technology: Effects of halo implant"],"prefix":"10.1109","author":[{"given":"Navid","family":"Paydavosi","sequence":"first","affiliation":[]},{"given":"Sriramkumar","family":"Venugopalan","sequence":"additional","affiliation":[]},{"given":"Angada","family":"Sachid","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Niknejad","sequence":"additional","affiliation":[]},{"given":"Chenming","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Sagnik","family":"Dey","sequence":"additional","affiliation":[]},{"given":"Samuel","family":"Martin","sequence":"additional","affiliation":[]},{"given":"Xin","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/16.47770"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/IEDM.2012.6479073"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/IEDM.2002.1175791"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/VLSIT.2010.5556235"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/16.108195"},{"key":"6","first-page":"537","article-title":"The impedance field method of noise calculation in active semiconductor devices","author":"s","year":"1966","journal-title":"Quantum Theory of Atoms Molecules and the Solid State a Tribute to John C -Slater"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1063\/1.2759653"},{"key":"4","first-page":"724","article-title":"BSIM6: Symmetric bulk MOSFET model","author":"chauhan","year":"2012","journal-title":"Technical Proceedings of the 2012 NSTI Nanotechnology Conference 2012"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1016\/j.sse.2006.09.010"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/VLSIT.2000.852809"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/TED.2004.831369"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/SISPAD.1997.621357"}],"event":{"name":"ESSDERC 2013 - 43rd European Solid State Device Research Conference","start":{"date-parts":[[2013,9,16]]},"location":"Bucharest, Romania","end":{"date-parts":[[2013,9,20]]}},"container-title":["2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6811819\/6818804\/06818863.pdf?arnumber=6818863","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T16:05:05Z","timestamp":1490285105000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6818863\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/essderc.2013.6818863","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}