{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T14:17:45Z","timestamp":1756995465410,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/essderc.2014.6948761","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:53:35Z","timestamp":1415814815000},"page":"74-77","source":"Crossref","is-referenced-by-count":5,"title":["Current dependence of the piezoresistive coefficients of CMOS FETs on (100) silicon"],"prefix":"10.1109","author":[{"given":"Safina","family":"Hussain","sequence":"first","affiliation":[]},{"given":"Richard C.","family":"Jaeger","sequence":"additional","affiliation":[]},{"given":"Jeffrey C.","family":"Suhling","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1968.10480934"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/16.641365"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ITHERM.2014.6892423"},{"key":"14","first-page":"386","article-title":"A rank-invariant method of linear and polynomial regression analysis","author":"theil","year":"1950","journal-title":"Nederlandse Akademie Wetenchappen Series A"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1982.20659"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/33.273694"},{"key":"3","first-page":"272","article-title":"FET mobility degradation and device mismatch due to packaging induced die stress","author":"jaeger","year":"1997","journal-title":"Proc 29th Eur Solid State Circuits Conf (ESSCIRC)"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/66.572070"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.1995.524719"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.94.42"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2001.923584"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.818923"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.813286"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/66.964317"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2247590"},{"key":"8","article-title":"Field effect transistor based CMOS stress sensors","volume":"2","author":"doelle","year":"2006","journal-title":"MEMS Technology and Engineering"}],"event":{"name":"ESSDERC 2014 - 44th European Solid State Device Research Conference","start":{"date-parts":[[2014,9,22]]},"location":"Venice Lido, Italy","end":{"date-parts":[[2014,9,26]]}},"container-title":["2014 44th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6926646\/6948742\/06948761.pdf?arnumber=6948761","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:05:28Z","timestamp":1490317528000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948761\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/essderc.2014.6948761","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}