{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T08:06:56Z","timestamp":1761293216595,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/essderc.2014.6948778","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T22:53:35Z","timestamp":1415832815000},"page":"142-145","source":"Crossref","is-referenced-by-count":9,"title":["Novel AlInN\/GaN integrated circuits operating up to 500 °C"],"prefix":"10.1109","author":[{"given":"R.","family":"Gaska","sequence":"first","affiliation":[]},{"given":"M.","family":"Gaevski","sequence":"additional","affiliation":[]},{"given":"J.","family":"Deng","sequence":"additional","affiliation":[]},{"given":"R.","family":"Jain","sequence":"additional","affiliation":[]},{"given":"G.","family":"Simin","sequence":"additional","affiliation":[]},{"given":"M.","family":"Shur","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2206792"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.200925188"},{"journal-title":"Method of Growing Nitride-Based Films Using Varying Pulses","year":"2007","author":"fareed","key":"10"},{"journal-title":"High-Temperature SOI Technologies at Honeywell in Extreme Environment Electronics","year":"2013","author":"ohme","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2045099"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.917815"},{"key":"5","doi-asserted-by":"crossref","DOI":"10.1088\/0268-1242\/28\/7\/074026","article-title":"GaN-on-insulator technology for high-temperature electronics beyond 400C","volume":"28","author":"herfurth","year":"2013","journal-title":"Semicond Sci Technol"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/pssc.200983483"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/16.777144"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.4.024101"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.200701047"}],"event":{"name":"ESSDERC 2014 - 44th European Solid State Device Research Conference","start":{"date-parts":[[2014,9,22]]},"location":"Venice Lido, Italy","end":{"date-parts":[[2014,9,26]]}},"container-title":["2014 44th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6926646\/6948742\/06948778.pdf?arnumber=6948778","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,17]],"date-time":"2019-08-17T08:40:05Z","timestamp":1566031205000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948778\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/essderc.2014.6948778","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}