{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:42:58Z","timestamp":1729665778367,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/essderc.2014.6948798","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:53:35Z","timestamp":1415814815000},"page":"214-217","source":"Crossref","is-referenced-by-count":10,"title":["Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs"],"prefix":"10.1109","author":[{"given":"E. G.","family":"Ioannidis","sequence":"first","affiliation":[]},{"given":"S.","family":"Haendler","sequence":"additional","affiliation":[]},{"given":"C. G.","family":"Theodorou","sequence":"additional","affiliation":[]},{"given":"N.","family":"Planes","sequence":"additional","affiliation":[]},{"given":"C. A.","family":"Dimitriadis","sequence":"additional","affiliation":[]},{"given":"G.","family":"Ghibaudo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2138142"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/16.735728"},{"key":"1","doi-asserted-by":"crossref","first-page":"1433","DOI":"10.1109\/JSSC.1989.572629","article-title":"Matching properties of MOS transistors","volume":"24","author":"pelgrom","year":"1989","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242497"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2012.12.001"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556222"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00025-2"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.10.007"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1049\/el.2013.1343"}],"event":{"name":"ESSDERC 2014 - 44th European Solid State Device Research Conference","start":{"date-parts":[[2014,9,22]]},"location":"Venice Lido, Italy","end":{"date-parts":[[2014,9,26]]}},"container-title":["2014 44th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6926646\/6948742\/06948798.pdf?arnumber=6948798","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T20:03:44Z","timestamp":1498161824000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948798\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/essderc.2014.6948798","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}