{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T23:05:47Z","timestamp":1747868747135},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/essderc.2014.6948799","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:53:35Z","timestamp":1415814815000},"page":"218-221","source":"Crossref","is-referenced-by-count":19,"title":["Variability in device degradations: Statistical observation of NBTI for 3996 transistors"],"prefix":"10.1109","author":[{"given":"Hiromitsu","family":"Awano","sequence":"first","affiliation":[]},{"given":"Masayuki","family":"Hiromoto","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Sato","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2011.6044214"},{"key":"2","first-page":"109","article-title":"On-the-fly characterization of NBTI in ultra-thin gate oxide PMOSFET's","author":"denais","year":"2004","journal-title":"Int Electron Devices Meeting"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251260"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2281986"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609445"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"}],"event":{"name":"ESSDERC 2014 - 44th European Solid State Device Research Conference","start":{"date-parts":[[2014,9,22]]},"location":"Venice Lido, Italy","end":{"date-parts":[[2014,9,26]]}},"container-title":["2014 44th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6926646\/6948742\/06948799.pdf?arnumber=6948799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:00:27Z","timestamp":1490317227000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948799\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/essderc.2014.6948799","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}