{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:10:35Z","timestamp":1729609835275,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/essderc.2014.6948819","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T22:53:35Z","timestamp":1415832815000},"page":"298-301","source":"Crossref","is-referenced-by-count":1,"title":["Effects of constant voltage stress on organic complementary logic inverters"],"prefix":"10.1109","author":[{"given":"N.","family":"Wrachien","sequence":"first","affiliation":[]},{"given":"A.","family":"Cester","sequence":"additional","affiliation":[]},{"given":"N.","family":"Lago","sequence":"additional","affiliation":[]},{"given":"G.","family":"Meneghesso","sequence":"additional","affiliation":[]},{"given":"R.","family":"D'Alpaos","sequence":"additional","affiliation":[]},{"given":"A.","family":"Stefani","sequence":"additional","affiliation":[]},{"given":"G.","family":"Turatti","sequence":"additional","affiliation":[]},{"given":"M.","family":"Muccini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"53303","DOI":"10.1063\/1.3077192","volume":"94","author":"walser","year":"2009","journal-title":"Appl Phys Lett"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2084559"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2751"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1021\/cm049614j"},{"key":"7","doi-asserted-by":"crossref","first-page":"1861","DOI":"10.1016\/j.microrel.2010.07.047","article-title":"Ambipolar field-effect transistor based on alpha,omegadihexylquaterthiophene and alpha,omega-diperfluoroquaterthiophene vertical heterojunction","volume":"50","author":"generali","year":"2010","journal-title":"Microel Reliab"},{"key":"6","doi-asserted-by":"crossref","first-page":"233301","DOI":"10.1063\/1.3267055","volume":"95","author":"walser","year":"2009","journal-title":"Appl Phys Lett"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1394718"},{"key":"4","doi-asserted-by":"crossref","first-page":"233307","DOI":"10.1063\/1.3153510","volume":"94","author":"ng","year":"2009","journal-title":"Appl Phys Lett"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1323534"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.085"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1021\/ja075242e"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200390003"}],"event":{"name":"ESSDERC 2014 - 44th European Solid State Device Research Conference","start":{"date-parts":[[2014,9,22]]},"location":"Venice Lido, Italy","end":{"date-parts":[[2014,9,26]]}},"container-title":["2014 44th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6926646\/6948742\/06948819.pdf?arnumber=6948819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T00:03:46Z","timestamp":1498176226000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/essderc.2014.6948819","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}