{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:51:02Z","timestamp":1730220662814,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/essderc.2015.7324727","type":"proceedings-article","created":{"date-parts":[[2015,11,12]],"date-time":"2015-11-12T23:03:10Z","timestamp":1447369390000},"page":"118-121","source":"Crossref","is-referenced-by-count":3,"title":["On the voltage scaling potential of SONOS non-volatile memory transistors"],"prefix":"10.1109","author":[{"given":"J.","family":"Ocker","sequence":"first","affiliation":[{"name":"NaMLab gGmbH, Dresden, Germany"}]},{"given":"S.","family":"Slesazeck","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH, Dresden, Germany"}]},{"given":"T.","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"TU Dresden, Dresden, Germany"}]},{"given":"S.","family":"Buschbeck","sequence":"additional","affiliation":[{"name":"Anvo-Systems Dresden GmbH, Dresden, Germany"}]},{"given":"S.","family":"Gunther","sequence":"additional","affiliation":[{"name":"Anvo-Systems Dresden GmbH, Dresden, Germany"}]},{"given":"E.","family":"Yurchuk","sequence":"additional","affiliation":[{"name":"Anvo-Systems Dresden GmbH, Dresden, Germany"}]},{"given":"R.","family":"Hoffmann","sequence":"additional","affiliation":[{"name":"Fraunhofer IPMS Dresden, Germany"}]},{"given":"V.","family":"Beyer","sequence":"additional","affiliation":[{"name":"Fraunhofer IPMS Dresden, Germany"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCDG.2013.6656301"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(94)90057-4"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.5573\/JSTS.2012.12.4.449"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2010.11.004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026113"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2006.876614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1343892"},{"key":"ref2","first-page":"33","article-title":"Scaling of Nonvolatile Memories to Nanoscale Feature Sizes","volume":"25","author":"mikolajick","year":"2007","journal-title":"Materials Sci -Poland"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/5\/1\/012026"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2013.6582134"}],"event":{"name":"ESSDERC 2015 - 45th European Solid-State Device Research Conference","start":{"date-parts":[[2015,9,14]]},"location":"Graz, Austria","end":{"date-parts":[[2015,9,18]]}},"container-title":["2015 45th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7300344\/7324696\/07324727.pdf?arnumber=7324727","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,7]],"date-time":"2021-06-07T18:18:15Z","timestamp":1623089895000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7324727\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/essderc.2015.7324727","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}