{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:51:08Z","timestamp":1730220668419,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/essderc.2015.7324755","type":"proceedings-article","created":{"date-parts":[[2015,11,12]],"date-time":"2015-11-12T18:03:10Z","timestamp":1447351390000},"page":"226-229","source":"Crossref","is-referenced-by-count":5,"title":["Experimental evidences and simulations of trap generation along a percolation path"],"prefix":"10.1109","author":[{"given":"Louis","family":"Gerrer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Razaidi","family":"Hussin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Salvatore M.","family":"Amoroso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Franco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Weckx","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Simicic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Horiguchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ben","family":"Kaczer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Grasser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Asen","family":"Asenov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.02.016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.01.024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.806802"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241839"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531974"},{"key":"ref15","first-page":"3a.2.1","author":"gerrer","year":"2013","journal-title":"Interplay Between Statistical Reliability and Variability A Comprehensive Transistor-to-Circuit Simulation Technology Proc of International Reliability and failure Physics Symposium (IRPS)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.82.245318"},{"key":"ref17","first-page":"779","article-title":"Impact of Individual Charged Gate-Oxide Defects on the Entire I-D-V-G Characteristic of Nanoscaled FETs","volume":"33?6","author":"franco","year":"0","journal-title":"IEEE Electron Dev Lett"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2336698"},{"key":"ref19","article-title":"Reliability aware simulation flow: from TCAD calibration to circuit level analysis","author":"hussin","year":"0","journal-title":"submitted in SISPAD 2015"},{"key":"ref4","first-page":"130","article-title":"Comprehensive SRAM design methodology for RTN reliability","volume":"2011","author":"takeuchi","year":"2011","journal-title":"VLSI Symp Tech Dig"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131500"},{"key":"ref6","first-page":"26","article-title":"Origin of NBTI variability in deply scaled pfets","volume":"2010","author":"kaczer","year":"2010","journal-title":"Proc IRPS"},{"key":"ref5","first-page":"7","article-title":"The statistical analysis of individual defects constituting NBTI and its implications for modeling de- and ac-stress","volume":"2010","author":"reisinger","year":"2010","journal-title":"Proc IRPS"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241841"},{"key":"ref7","first-page":"39","volume":"52","author":"grasser","year":"2012","journal-title":"Stochastic charge trapping in oxides From random telegraph noise to bias temperature instabilities Micro Reliability"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2057230"},{"journal-title":"SAMURAI An accurate method for modelling and simulating nonstationary Random Telegraph Noise in SRAMs Design Automation & Test in Europe Conference & Exhibition (DATE)","year":"2011","author":"aadithya","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241935"},{"year":"0","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(03)00030-3"}],"event":{"name":"ESSDERC 2015 - 45th European Solid-State Device Research Conference","start":{"date-parts":[[2015,9,14]]},"location":"Graz, Austria","end":{"date-parts":[[2015,9,18]]}},"container-title":["2015 45th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7300344\/7324696\/07324755.pdf?arnumber=7324755","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:15:34Z","timestamp":1490386534000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7324755\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/essderc.2015.7324755","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}