{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,22]],"date-time":"2025-11-22T11:04:55Z","timestamp":1763809495509},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/essderc.2015.7324775","type":"proceedings-article","created":{"date-parts":[[2015,11,12]],"date-time":"2015-11-12T18:03:10Z","timestamp":1447351390000},"page":"306-309","source":"Crossref","is-referenced-by-count":2,"title":["Improved surface roughness modeling and mobility projections in thin film MOSFETs"],"prefix":"10.1109","author":[{"given":"O.","family":"Badami","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Caruso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Lizzit","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Esseni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Palestri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Selmi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/55.485166"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/55.817444"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.2896589"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/16.337449"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2012880"},{"key":"ref15","first-page":"637","author":"xuan","year":"2007","journal-title":"IEEE IEDM Tech Dig"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2315919"},{"key":"ref17","first-page":"23.1.1","author":"uchida","year":"2008","journal-title":"IEEE IEDM Tech Dig"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.4.114201"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.2764438"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2068990"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.822344"},{"key":"ref6","first-page":"176","author":"osgnach","year":"2013","journal-title":"Proc SISPAD"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.894606"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511973857"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1969.1054328"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.03.120"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.32.8171"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4903768"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.1521517"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.1368156"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"11992","DOI":"10.1103\/PhysRevB.41.11992","author":"bahder","year":"1990","journal-title":"Physical Review B"},{"key":"ref24","first-page":"27.2.1","author":"taoka","year":"2011","journal-title":"IEEE IEDM Tech Dig"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2014.12.011"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.5.014201"}],"event":{"name":"ESSDERC 2015 - 45th European Solid-State Device Research Conference","start":{"date-parts":[[2015,9,14]]},"location":"Graz, Austria","end":{"date-parts":[[2015,9,18]]}},"container-title":["2015 45th European Solid State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7300344\/7324696\/07324775.pdf?arnumber=7324775","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T19:32:50Z","timestamp":1498246370000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7324775\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/essderc.2015.7324775","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}