{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T15:29:58Z","timestamp":1767108598282},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/essderc.2016.7599607","type":"proceedings-article","created":{"date-parts":[[2016,10,20]],"date-time":"2016-10-20T17:00:55Z","timestamp":1476982855000},"page":"142-145","source":"Crossref","is-referenced-by-count":8,"title":["Statistical characterization of drain current local and global variability in sub 15nm Si\/SiGe Trigate pMOSFETs"],"prefix":"10.1109","author":[{"given":"R.","family":"Lavieville","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Karatsori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Theodorou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Barraud","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.A.","family":"Dimitriadis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Ghibaudo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047062"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2212691"},{"key":"ref6","first-page":"307","article-title":"Mobility characterization in advanced FD-SOI CMOS devices","author":"ghibaudo","year":"2010","journal-title":"Semiconductor-on-Insulator Material for Nanoelectronics Applications"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/el:19880369"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2016.01.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2411289"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556136"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419095"}],"event":{"name":"ESSDERC 2016 - 46th European Solid-State Device Research Conference","start":{"date-parts":[[2016,9,12]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2016,9,15]]}},"container-title":["2016 46th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7584557\/7598672\/07599607.pdf?arnumber=7599607","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,11,16]],"date-time":"2016-11-16T09:46:49Z","timestamp":1479289609000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7599607\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/essderc.2016.7599607","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}