{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T17:25:02Z","timestamp":1772645102964,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/essderc.2017.8066596","type":"proceedings-article","created":{"date-parts":[[2017,10,25]],"date-time":"2017-10-25T20:13:21Z","timestamp":1508962401000},"page":"78-81","source":"Crossref","is-referenced-by-count":23,"title":["Negative capacitance field effect transistors; capacitance matching and non-hysteretic operation"],"prefix":"10.1109","author":[{"given":"Ali","family":"Saeidi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Farzan","family":"Jazaeri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Bellando","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Igor","family":"Stolichnov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian C.","family":"Enz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adrian M.","family":"Ionescu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/nl502691u"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2616035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/E3S.2013.6705876"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131532"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/27\/11\/115201"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2316167"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.121610"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1566478"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/nature17659"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/nn5064216"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.4704179"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796789"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703374"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/nl071804g"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b01130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796642"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131563"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/nl5017255"}],"event":{"name":"ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)","location":"Leuven, Belgium","start":{"date-parts":[[2017,9,11]]},"end":{"date-parts":[[2017,9,14]]}},"container-title":["2017 47th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8059714\/8066575\/08066596.pdf?arnumber=8066596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,30]],"date-time":"2017-11-30T19:58:35Z","timestamp":1512071915000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8066596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/essderc.2017.8066596","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}