{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,2]],"date-time":"2025-05-02T13:12:21Z","timestamp":1746191541718,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/essderc.2017.8066599","type":"proceedings-article","created":{"date-parts":[[2017,10,25]],"date-time":"2017-10-25T16:13:21Z","timestamp":1508948001000},"page":"90-93","source":"Crossref","is-referenced-by-count":5,"title":["Analytical drain current model for non-ballistic Schottky-Barrier CNTFETs"],"prefix":"10.1109","author":[{"given":"Igor","family":"Bejenari","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Schroter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Claus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TED.2014.2373149"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1063\/1.1923183"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1021\/nl8018802"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TED.2006.890384"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TED.2010.2049219"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TED.2015.2457453"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TED.2008.922494"},{"key":"ref17","first-page":"770","article-title":"Critical review of CNTFET compact models","volume":"2","author":"claus","year":"2012","journal-title":"Workshop on Compact Modeling NSTI-Nanotech"},{"year":"0","author":"bejenari","journal-title":"Analytical model of one-dimensional ballistic Schottky-Barrier transistors","key":"ref18"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TED.2015.2512180"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/JEDS.2013.2244641"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1126\/science.aaj1628"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1039\/C6NR01012A"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1021\/nl0508624"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1038\/nnano.2011.196"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.sse.2013.06.013"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TED.2003.821883"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.sse.2016.07.011"},{"year":"2016","journal-title":"International Roadmap for Devices and Systems MORE MOORE White Paper","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1103\/PhysRevLett.81.2506"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TED.2003.815366"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/TNANO.2015.2397696"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1038\/nnano.2010.220"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TED.2009.2017647"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1103\/PhysRevLett.84.2941"}],"event":{"name":"ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2017,9,11]]},"location":"Leuven, Belgium","end":{"date-parts":[[2017,9,14]]}},"container-title":["2017 47th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8059714\/8066575\/08066599.pdf?arnumber=8066599","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,30]],"date-time":"2017-11-30T15:59:19Z","timestamp":1512057559000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8066599\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/essderc.2017.8066599","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}