{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T04:12:23Z","timestamp":1725423143025},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/essderc.2018.8486910","type":"proceedings-article","created":{"date-parts":[[2018,10,18]],"date-time":"2018-10-18T18:50:05Z","timestamp":1539888605000},"page":"22-25","source":"Crossref","is-referenced-by-count":2,"title":["Localization and analysis of surface charges trapped in AlGaN\/GaN HEMTs using multiple secondary MIS gates"],"prefix":"10.1109","author":[{"given":"L.","family":"Heuken","sequence":"first","affiliation":[]},{"given":"M.","family":"Alshahed","sequence":"additional","affiliation":[]},{"given":"A.","family":"Ottaviani","sequence":"additional","affiliation":[]},{"given":"M.","family":"Alomari","sequence":"additional","affiliation":[]},{"given":"J.N.","family":"Burghartz","sequence":"additional","affiliation":[]},{"given":"U.","family":"Waizmann","sequence":"additional","affiliation":[]},{"given":"T.","family":"Reindl","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2002.807687"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.835025"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/INMIC.2008.4777714"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.50.061001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.812489"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.diamond.2009.09.003"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.1835551"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.53.070301"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885681"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.2775834"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/16.906451"}],"event":{"name":"48th European Solid-State Device Research Conference (ESSDERC 2018)","start":{"date-parts":[[2018,9,3]]},"location":"Dresden","end":{"date-parts":[[2018,9,6]]}},"container-title":["2018 48th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8476153\/8486846\/08486910.pdf?arnumber=8486910","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T03:20:06Z","timestamp":1598239206000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8486910\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/essderc.2018.8486910","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}