{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:42:26Z","timestamp":1755801746960,"version":"3.44.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/essderc.2019.8901714","type":"proceedings-article","created":{"date-parts":[[2019,11,25]],"date-time":"2019-11-25T14:01:19Z","timestamp":1574690479000},"page":"194-197","source":"Crossref","is-referenced-by-count":3,"title":["Compact Analytical Model for Trap-Related Low Frequency Noise in Junctionless Transistors"],"prefix":"10.1109","author":[{"given":"Renan","family":"Trevisoli","sequence":"first","affiliation":[{"name":"Universidade Federal do ABC,CECS,Santo André,Brazil"}]},{"given":"Rodrigo","family":"Doria","sequence":"additional","affiliation":[{"name":"Centro Universitário FEI,Electrical Engineering Department,São Bernardo do Campo,Brazil"}]},{"given":"Sylvain","family":"Barraud","sequence":"additional","affiliation":[{"name":"University of Grenoble Alpes,Grenoble,France"}]},{"given":"Marcelo","family":"Pavanello","sequence":"additional","affiliation":[{"name":"Centro Universitário FEI,Electrical Engineering Department,São Bernardo do Campo,Brazil"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2012.12.003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.3569724"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.111005"},{"journal-title":"MOS Physics and Technology","year":"1982","author":"nicollian","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2219055"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2507571"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2018.8640199"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850955"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.87.835"},{"journal-title":"Synopsys Sentaurus Device User Guide","year":"2016","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.06.004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2009.5318737"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-5910-0"},{"key":"ref5","article-title":"Electrical Performances of Junctionless-FETs at the Scaling Limit (LCH = 3 nm)","author":"migita","year":"2012","journal-title":"IEEE International Electron Devices Meeting (IEDM)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2013.03.090"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2169645"},{"year":"0","key":"ref2"},{"journal-title":"FinFETs and Other Multi-Gate Transistors","year":"2007","author":"colinge","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2014.04.019"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.04.014"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2309334"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2203091"}],"event":{"name":"ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2019,9,23]]},"location":"Cracow, Poland","end":{"date-parts":[[2019,9,26]]}},"container-title":["ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8894830\/8901681\/08901714.pdf?arnumber=8901714","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:32:54Z","timestamp":1755714774000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8901714\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/essderc.2019.8901714","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}