{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T00:07:40Z","timestamp":1773965260233,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/essderc.2019.8901761","type":"proceedings-article","created":{"date-parts":[[2019,11,25]],"date-time":"2019-11-25T14:01:19Z","timestamp":1574690479000},"page":"82-85","source":"Crossref","is-referenced-by-count":6,"title":["Characterization and Modeling of BTI in SiC MOSFETs"],"prefix":"10.1109","author":[{"given":"D.","family":"Cornigli","sequence":"first","affiliation":[{"name":"University of Bologna,ARCES and DEI,Bologna,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. N.","family":"Tallarico","sequence":"additional","affiliation":[{"name":"University of Bologna,ARCES and DEI,Cesena,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Reggiani","sequence":"additional","affiliation":[{"name":"University of Bologna,ARCES and DEI,Bologna,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Fiegna","sequence":"additional","affiliation":[{"name":"University of Bologna,ARCES and DEI,Cesena,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Sangiorgi","sequence":"additional","affiliation":[{"name":"University of Bologna,ARCES and DEI,Cesena,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Sanchez","sequence":"additional","affiliation":[{"name":"Università della Calabria,Rende (Cosenza),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Valdivieso","sequence":"additional","affiliation":[{"name":"Università della Calabria,Rende (Cosenza),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Consentino","sequence":"additional","affiliation":[{"name":"Università della Calabria,Rende (Cosenza),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Crupi","sequence":"additional","affiliation":[{"name":"Università della Calabria,Rende (Cosenza),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2018.8486896"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.556-557.827"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173221"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2009.5290226"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.912779"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201600366"},{"key":"ref3","first-page":"s1839s1856","volume":"16","author":"afanasev","year":"2004","journal-title":"J Phys Condens Matter"},{"key":"ref6","year":"2018","journal-title":"Sentaurus Device User Guide"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.06.109"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813333"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2018.2813063"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2356172"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2308580"}],"event":{"name":"ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)","location":"Cracow, Poland","start":{"date-parts":[[2019,9,23]]},"end":{"date-parts":[[2019,9,26]]}},"container-title":["ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8894830\/8901681\/08901761.pdf?arnumber=8901761","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:21:41Z","timestamp":1755800501000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8901761\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/essderc.2019.8901761","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}