{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,13]],"date-time":"2025-10-13T20:02:16Z","timestamp":1760385736992,"version":"3.44.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/essderc.2019.8901825","type":"proceedings-article","created":{"date-parts":[[2019,11,25]],"date-time":"2019-11-25T14:01:19Z","timestamp":1574690479000},"page":"210-213","source":"Crossref","is-referenced-by-count":7,"title":["Body-biasing considerations with SPAD FDSOI: advantages and drawbacks"],"prefix":"10.1109","author":[{"given":"T. Chaves","family":"de Albuquerque","sequence":"first","affiliation":[{"name":"Université de Lyon,INL - Institut des Nanotechnologies de Lyon, UMR CNRS 5270,France"}]},{"given":"D.","family":"Issartel","sequence":"additional","affiliation":[{"name":"Université de Lyon,INL - Institut des Nanotechnologies de Lyon, UMR CNRS 5270,France"}]},{"given":"R.","family":"Clerc","sequence":"additional","affiliation":[{"name":"Université Jean Monnet & Institut d'Optique Graduate School,LHC - Laboratoire Hubert Curien, UMR CNRS 5516,Saint Etienne,France"}]},{"given":"P.","family":"Pittet","sequence":"additional","affiliation":[{"name":"Université de Lyon,INL - Institut des Nanotechnologies de Lyon, UMR CNRS 5270,France"}]},{"given":"R.","family":"Cellier","sequence":"additional","affiliation":[{"name":"Université de Lyon,INL - Institut des Nanotechnologies de Lyon, UMR CNRS 5270,France"}]},{"given":"W.","family":"Uhring","sequence":"additional","affiliation":[{"name":"Université de Strasbourg,ICube, UMR CNRS 7357,France"}]},{"given":"A.","family":"Cathelin","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"F.","family":"Calmon","sequence":"additional","affiliation":[{"name":"Université de Lyon,INL - Institut des Nanotechnologies de Lyon, UMR CNRS 5270,France"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1109\/ESSDERC.2018.8486852","article-title":"Integration of SPAD in 28nm FDSOI CMOS technology","author":"chaves de albuquerque","year":"2018","journal-title":"Solid-State Device Research Conference (ESSDERC) 2018 48th European"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2016.10.014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2017.2745738"},{"key":"ref5","article-title":"Lowering the Dark Count Rate of SPAD Implemented in CMOS FDSOI Technology","author":"chaves de albuquerque","year":"0","journal-title":"EUROSOI – ULIS 2019 conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2458339"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1713636"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.57.1002A3"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2905163"}],"event":{"name":"ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2019,9,23]]},"location":"Cracow, Poland","end":{"date-parts":[[2019,9,26]]}},"container-title":["ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8894830\/8901681\/08901825.pdf?arnumber=8901825","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:19:31Z","timestamp":1756754371000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8901825\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/essderc.2019.8901825","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}