{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T13:43:09Z","timestamp":1774964589550,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,13]],"date-time":"2021-09-13T00:00:00Z","timestamp":1631491200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100011688","name":"ECSEL JU","doi-asserted-by":"publisher","award":["826600"],"award-info":[{"award-number":["826600"]}],"id":[{"id":"10.13039\/501100011688","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,13]]},"DOI":"10.1109\/essderc53440.2021.9631797","type":"proceedings-article","created":{"date-parts":[[2021,12,13]],"date-time":"2021-12-13T21:10:04Z","timestamp":1639429804000},"page":"143-146","source":"Crossref","is-referenced-by-count":9,"title":["Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study"],"prefix":"10.1109","author":[{"given":"Mathieu","family":"Sicre","sequence":"first","affiliation":[]},{"given":"Megan","family":"Agnew","sequence":"additional","affiliation":[]},{"given":"Christel","family":"Buj","sequence":"additional","affiliation":[]},{"given":"Jean","family":"Coignus","sequence":"additional","affiliation":[]},{"given":"Dominique","family":"Golanski","sequence":"additional","affiliation":[]},{"given":"Remi","family":"Helleboid","sequence":"additional","affiliation":[]},{"given":"Bastien","family":"Mamdy","sequence":"additional","affiliation":[]},{"given":"Isobel","family":"Nicholson","sequence":"additional","affiliation":[]},{"given":"Sara","family":"Pellegrini","sequence":"additional","affiliation":[]},{"given":"Denis","family":"Rideau","sequence":"additional","affiliation":[]},{"given":"David","family":"Roy","sequence":"additional","affiliation":[]},{"given":"Francis","family":"Calmon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1973.17715"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.87.835"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/16.121690"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(93)90065-X"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(76)90022-8"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(92)90184-E"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(96)00201-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-81832-5"},{"key":"ref4","author":"moussy","year":"2017","journal-title":"SPAD-TYPE PHOTODIODE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/31\/6\/065024"},{"key":"ref6","year":"2019","journal-title":"Sentaurus User Guide Version P-2019 03"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/9585931"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.109.1537"},{"key":"ref7","year":"2019","journal-title":"SentaurusTM Device User Guide Version P-2019 03"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2971108"},{"key":"ref1","article-title":"A Review of Single-Photon Avalanche Diode Time-of-Flight Imaging Sensor Arrays","author":"piron","year":"2020","journal-title":"IEEE Sensors Journal"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(70)90139-5"}],"event":{"name":"ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)","location":"Grenoble, France","start":{"date-parts":[[2021,9,13]]},"end":{"date-parts":[[2021,9,22]]}},"container-title":["ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9631379\/9631380\/09631797.pdf?arnumber=9631797","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:54:09Z","timestamp":1652201649000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9631797\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,13]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/essderc53440.2021.9631797","relation":{},"subject":[],"published":{"date-parts":[[2021,9,13]]}}}