{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T02:17:36Z","timestamp":1782353856091,"version":"3.54.5"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,19]]},"DOI":"10.1109\/essderc55479.2022.9947161","type":"proceedings-article","created":{"date-parts":[[2022,11,18]],"date-time":"2022-11-18T20:49:46Z","timestamp":1668804586000},"page":"316-319","source":"Crossref","is-referenced-by-count":4,"title":["Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model"],"prefix":"10.1109","author":[{"given":"Tommaso","family":"Zanotti","sequence":"first","affiliation":[{"name":"University of Modena and Reggio Emilia,DIEF,Modena,MO,Italy,41125"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paolo","family":"Pavan","sequence":"additional","affiliation":[{"name":"University of Modena and Reggio Emilia,DIEF,Modena,MO,Italy,41125"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Francesco Maria","family":"Puglisi","sequence":"additional","affiliation":[{"name":"University of Modena and Reggio Emilia,DIEF,Modena,MO,Italy,41125"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479018"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2011.5872251"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2582859"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.3637603"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.2807282"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2397192"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.5113536"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nature08940"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2912946"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1186\/s11671-017-2419-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2014.6948807"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050789"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3003007"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref9","author":"puglisi","year":"2019","journal-title":"Unimore Resistive Random Access Memory (RRAM) Verilog-A Model nanoHUB"}],"event":{"name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","location":"Milan, Italy","start":{"date-parts":[[2022,9,19]]},"end":{"date-parts":[[2022,9,22]]}},"container-title":["ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9947060\/9947094\/09947161.pdf?arnumber=9947161","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:56:43Z","timestamp":1670875003000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9947161\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,19]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/essderc55479.2022.9947161","relation":{},"subject":[],"published":{"date-parts":[[2022,9,19]]}}}