{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T04:44:48Z","timestamp":1725684288809},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T00:00:00Z","timestamp":1694390400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T00:00:00Z","timestamp":1694390400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,11]]},"DOI":"10.1109\/essderc59256.2023.10268528","type":"proceedings-article","created":{"date-parts":[[2023,10,2]],"date-time":"2023-10-02T17:46:40Z","timestamp":1696268800000},"page":"17-20","source":"Crossref","is-referenced-by-count":0,"title":["Impact of layout and channel processing on CMOS low frequency noise variability"],"prefix":"10.1109","author":[{"given":"Fausto","family":"Simioni","sequence":"first","affiliation":[{"name":"STMicroelectronics,Cornaredo,MI,Italy"}]},{"given":"Lorenzo","family":"Labate","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Cornaredo,MI,Italy"}]},{"given":"Daniele","family":"Savio","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Cornaredo,MI,Italy"}]},{"given":"Mariella","family":"Brizzi","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Agrate Brianza,MB,Italy"}]},{"given":"Federica","family":"Ottogalli","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Agrate Brianza,MB,Italy"}]},{"given":"Riccardo","family":"Marchetti","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Agrate Brianza,MB,Italy"}]},{"given":"Silvia","family":"Brazzelli","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Cornaredo,MI,Italy"}]},{"given":"Mattia","family":"Rossetti","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Cornaredo,MI,Italy"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667684"},{"journal-title":"BCD Technology for Smart Power ICs","year":"2002","author":"andreini","key":"ref3"},{"key":"ref6","first-page":"171","article-title":"Modeling of pocket implanted MOSFETs for anomalous analog behavior","author":"cao","year":"1999","journal-title":"International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-37500-3_2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2593916"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/16.108195"}],"event":{"name":"ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2023,9,11]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2023,9,14]]}},"container-title":["ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10268496\/10268469\/10268528.pdf?arnumber=10268528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T17:52:44Z","timestamp":1698083564000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10268528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/essderc59256.2023.10268528","relation":{},"subject":[],"published":{"date-parts":[[2023,9,11]]}}}