{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T22:41:11Z","timestamp":1729636871485,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1109\/etfa.2008.4638367","type":"proceedings-article","created":{"date-parts":[[2008,10,7]],"date-time":"2008-10-07T18:08:47Z","timestamp":1223402927000},"page":"36-39","source":"Crossref","is-referenced-by-count":0,"title":["On full aspect conveyed object inspection at high speed"],"prefix":"10.1109","author":[{"given":"Marc","family":"Pearson","sequence":"first","affiliation":[]},{"given":"Tim","family":"Clarke","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"243","DOI":"10.1016\/S0065-2458(08)60646-4","article-title":"3-d computer vision using structured light: design, calibration, and implementation issues","volume":"43","author":"depiero","year":"1996","journal-title":"Advances in Computers"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-1699(02)00101-1"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1364\/AO.30.002873"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ROSE.2005.1588327"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/IM.1999.805338"},{"key":"4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0924-4247(98)00283-0","article-title":"subpixel measurement of 3d surfaces by laser scanning","volume":"76","author":"izquierdo","year":"1999","journal-title":"Sensors and Actuators"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1080\/095119298130642"}],"event":{"name":"Factory Automation (ETFA 2008)","start":{"date-parts":[[2008,9,15]]},"location":"Hamburg, Germany","end":{"date-parts":[[2008,9,18]]}},"container-title":["2008 IEEE International Conference on Emerging Technologies and Factory Automation"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4631965\/4638343\/04638367.pdf?arnumber=4638367","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T12:22:02Z","timestamp":1497788522000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4638367\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/etfa.2008.4638367","relation":{},"subject":[],"published":{"date-parts":[[2008,9]]}}}