{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:20:29Z","timestamp":1725704429015},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/etfa.2010.5641270","type":"proceedings-article","created":{"date-parts":[[2010,11,30]],"date-time":"2010-11-30T16:11:18Z","timestamp":1291133478000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["A concept for conformance testing of AutomationML models by means of formal proof using OCL"],"prefix":"10.1109","author":[{"given":"Miriam","family":"Schleipen","sequence":"first","affiliation":[{"name":"Fraunhofer IOSB, Fraunhoferstr. 1, 76131 Karlsruhe, Germany"}]}],"member":"263","reference":[{"journal-title":"Foundation of the Theory of Signs","year":"1938","author":"morris","key":"3"},{"journal-title":"Datenaustausch in der Automatisierungsplanung Mit AutomationML","year":"2009","author":"drath","key":"2"},{"year":"2010","key":"10"},{"key":"1","first-page":"33","article-title":"Die Zukunft des Engineering. Herausforderungen an das Engineering von fertigungsund verfahrenstechnischen Anlagen","author":"drath","year":"2008","journal-title":"KLK 2008"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2009.5347260"},{"key":"6","article-title":"Self-configuring visualization of a production monitoring and control system","author":"schleipen","year":"0","journal-title":"CIRP ICME 08 July 2008"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2008.4676932"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S1385-7258(54)50074-0"},{"year":"2010","key":"9"},{"key":"8","first-page":"662","article-title":"Usage of dynamic product and process information in a production monitoring and control system by means of CAEX and OPC UA","author":"schleipen","year":"0","journal-title":"3rd CIRP CAPE 2009 2009"},{"journal-title":"STEP Conformance Checker","year":"2010","key":"11"},{"journal-title":"Parts 3x Conformance Testing Methodology and Framework","year":"0","key":"12"}],"event":{"name":"2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)","start":{"date-parts":[[2010,9,13]]},"location":"Bilbao, Spain","end":{"date-parts":[[2010,9,16]]}},"container-title":["2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5623495\/5640954\/05641270.pdf?arnumber=5641270","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T05:23:39Z","timestamp":1623129819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5641270\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/etfa.2010.5641270","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}