{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:29:01Z","timestamp":1729610941930,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/etfa.2010.5641292","type":"proceedings-article","created":{"date-parts":[[2010,11,30]],"date-time":"2010-11-30T16:11:18Z","timestamp":1291133478000},"page":"1-8","source":"Crossref","is-referenced-by-count":1,"title":["Monitoring and fault detection in processes with multiple operating modes, transitory phases and start-ups using principal component analysis"],"prefix":"10.1109","author":[{"given":"D","family":"Garcia-Alvarez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M J","family":"Fuente","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G","family":"Sainz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(87)80084-9"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2004.1432212"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(98)00162-2"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"journal-title":"Aplicacion de Tecnicas Estadisticas Multivariantes Al Control de la Calidad de Procesos Por Lotes","year":"2004","author":"zarzo","key":"24"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00093-5"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1995.10485888"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1191\/0142331203tm071oa"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(00)00022-6"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690370209"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1080\/02664760120034144"},{"journal-title":"Fault Detection and Diagnosis in Industrial Systems","year":"2000","author":"chiang","key":"3"},{"key":"20","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1016\/S0098-1354(02)00162-X","article-title":"A review of process fault detection and diagnosis. part iii: Process history based methods","volume":"27","author":"venkatasubramanian","year":"2003","journal-title":"Computers & Chemical Engineering"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-007-1790-1"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1002\/cem.750"},{"key":"10","doi-asserted-by":"crossref","first-page":"409","DOI":"10.1080\/00224065.1996.11979699","article-title":"Multivariate spc methods for process and product monitoring","volume":"28","author":"kourti","year":"1996","journal-title":"Journal of Quality Technology"},{"key":"7","doi-asserted-by":"crossref","DOI":"10.1002\/0471725331","author":"jackson","year":"1991","journal-title":"A User's Guide to Principal Components"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(99)00038-6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MED.2008.4602082"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.2307\/1267581"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1002\/cem.778"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1002\/1099-128X(200005\/06)14:3<105::AID-CEM582>3.0.CO;2-I"}],"event":{"name":"Factory Automation (ETFA 2010)","start":{"date-parts":[[2010,9,13]]},"location":"Bilbao","end":{"date-parts":[[2010,9,16]]}},"container-title":["2010 IEEE 15th Conference on Emerging Technologies &amp; Factory Automation (ETFA 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5623495\/5640954\/05641292.pdf?arnumber=5641292","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,6]],"date-time":"2019-06-06T13:55:59Z","timestamp":1559829359000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5641292\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/etfa.2010.5641292","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}