{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T00:15:55Z","timestamp":1756167355529,"version":"3.44.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,9,1]],"date-time":"2012-09-01T00:00:00Z","timestamp":1346457600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,9,1]],"date-time":"2012-09-01T00:00:00Z","timestamp":1346457600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/etfa.2012.6489690","type":"proceedings-article","created":{"date-parts":[[2013,4,5]],"date-time":"2013-04-05T16:57:59Z","timestamp":1365181079000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Model-driven development of industrial embedded systems: Challenges faced and lessons learnt"],"prefix":"10.1109","author":[{"given":"K.","family":"Nicholas","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering University of Auckland, New Zealand"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Z. E.","family":"Bhatti","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering University of Auckland, New Zealand"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P. S.","family":"Roop","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering University of Auckland, New Zealand"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Freescale","year":"2012","key":"3"},{"journal-title":"Analog Devices","year":"2012","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2007.4384944"},{"journal-title":"International Standard IEC 61499 Number IEC 61499 v2 International Electrotechnical Commission Geneva Switzerland","year":"2010","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2008.2007216"},{"journal-title":"A Model-Driven Approach for Safety Critical Systems","year":"2011","author":"bhatti","key":"6"},{"journal-title":"Tru-test EziWeigh Scales","year":"2012","key":"5"},{"journal-title":"Tru-Test An Agri-tech Manufacturing Company","year":"2012","key":"4"},{"key":"9","article-title":"Iec 61499 architecture for distributed automation: The glass half full","author":"thramboulidis","year":"2009","journal-title":"View Face to Face - IEEE Industrial Electronics Magazine"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2006.355422"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.128"}],"event":{"name":"2012 IEEE 17th Conference on Emerging Technologies & Factory Automation (ETFA 2012)","start":{"date-parts":[[2012,9,17]]},"location":"Krakow, Poland","end":{"date-parts":[[2012,9,21]]}},"container-title":["Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6479732\/6489522\/06489690.pdf?arnumber=6489690","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T20:18:35Z","timestamp":1756153115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6489690\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/etfa.2012.6489690","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}