{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T04:45:06Z","timestamp":1768365906751,"version":"3.49.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,9,1]],"date-time":"2016-09-01T00:00:00Z","timestamp":1472688000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,9,1]],"date-time":"2016-09-01T00:00:00Z","timestamp":1472688000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/etfa.2016.7733534","type":"proceedings-article","created":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T16:26:20Z","timestamp":1478535980000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Industrial process monitoring by means of recurrent neural networks and Self Organizing Maps"],"prefix":"10.1109","author":[{"given":"Daniel","family":"Zurita","sequence":"first","affiliation":[{"name":"MCIA Research Center, Department of Electronic Engineering, Technical University of Catalonia (UPC), Rbla. San Nebridi no22, Gaia Research Building, 08222 Terrassa, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enric","family":"Sala","sequence":"additional","affiliation":[{"name":"MCIA Research Center, Department of Electronic Engineering, Technical University of Catalonia (UPC), Rbla. San Nebridi no22, Gaia Research Building, 08222 Terrassa, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jes\u00fas A.","family":"Carino","sequence":"additional","affiliation":[{"name":"MCIA Research Center, Department of Electronic Engineering, Technical University of Catalonia (UPC), Rbla. San Nebridi no22, Gaia Research Building, 08222 Terrassa, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miguel","family":"Delgado","sequence":"additional","affiliation":[{"name":"MCIA Research Center, Department of Electronic Engineering, Technical University of Catalonia (UPC), Rbla. San Nebridi no22, Gaia Research Building, 08222 Terrassa, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juan A.","family":"Ortega","sequence":"additional","affiliation":[{"name":"MCIA Research Center, Department of Electronic Engineering, Technical University of Catalonia (UPC), Rbla. San Nebridi no22, Gaia Research Building, 08222 Terrassa, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2012.6209921"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098369"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2014.7005208"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/BigData.2014.7004336"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2350452"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2015.01.016"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2011.2169810"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/5.58325"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2258299"},{"key":"ref19","author":"vesanto","year":"2000","journal-title":"SOM Toolbox for Matlab 5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2013.09.043"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2013.6563627"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2015.7125354"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2219838"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FSKD.2015.7382284"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2222034"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336616"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2013.6645768"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2388958"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0925-2312(91)90045-D"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"2226","DOI":"10.1109\/TII.2013.2243743","article-title":"From Model, Signal to Knowledge: A Data-Driven Perspective of Fault Detection and Diagnosis","volume":"9","author":"xuewu","year":"2013","journal-title":"IEEE Trans Ind Informat"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.02.001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.79.8.2554"},{"key":"ref23","article-title":"A critical review of recurrent neural networks for sequence learning","author":"lipton","year":"2015","journal-title":"arXiv Prepr arXiv1506 00019"},{"key":"ref26","author":"rentz","year":"1999","journal-title":"Report on BAT in German Copper Production (Final Draft)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2007.896859"}],"event":{"name":"2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA)","location":"Berlin, Germany","start":{"date-parts":[[2016,9,6]]},"end":{"date-parts":[[2016,9,9]]}},"container-title":["2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7593665\/7733490\/07733534.pdf?arnumber=7733534","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T20:57:20Z","timestamp":1768337840000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7733534\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/etfa.2016.7733534","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}