{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T19:02:07Z","timestamp":1775329327779,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/etfa.2017.8247756","type":"proceedings-article","created":{"date-parts":[[2018,1,8]],"date-time":"2018-01-08T17:42:04Z","timestamp":1515433324000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Deflectometry setup definition for automatic chrome surface inspection"],"prefix":"10.1109","author":[{"given":"Alberto","family":"Isasi-Andrieu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Estibaliz","family":"Garrote-Contreras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pedro","family":"Iriondo-Bengoa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Aldama-Gant","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adrian","family":"Galdran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"105","article-title":"Curvature: the relevant criterion for Class-A surface quality","author":"hsakou","year":"2006","journal-title":"JEC Composites"},{"key":"ref11","first-page":"411","volume":"5457","author":"bothe","year":"2004","journal-title":"High-resolution 3D shape measurement on specular surfaces by fringe reflection"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.015090"},{"key":"ref13","year":"0","journal-title":"Dispositivo de iluminación sin brillos para la inspección de objetos mediante visión artificial"},{"key":"ref14","article-title":"Inspection of specular surfaces-Deflectometry for the inspection of specular surfaces","author":"werling","year":"2011","journal-title":"Fraunhofer IOSB"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.riai.2011.11.010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.08.002"},{"key":"ref6","first-page":"254","volume":"5079","author":"kammel","year":"2003","journal-title":"Head-mounted display for interactive inspection of painted free-form surfaces"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894185"},{"key":"ref8","first-page":"207","volume":"1266","author":"keren","year":"1990","journal-title":"Measurement of surface quality using a moire deflectometer"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.7973607"},{"key":"ref2","first-page":"41","article-title":"Wavelet Filter Bank Optimization for Classification of Deflectometry Measuring Data","volume":"17","author":"le","year":"2014","journal-title":"Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics Vision and Fusion Laboratory"},{"key":"ref1","first-page":"155","article-title":"Empirical Comparision of Defect Classifiers on Specular Surfaces","volume":"17","author":"zierbarth","year":"2014","journal-title":"Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics Vision and Fusion Laboratory"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"394","DOI":"10.1524\/teme.1997.64.jg.394","article-title":"Automated inspection of specular surfaces by means of pattern reflections","volume":"64","author":"beyerer","year":"1997","journal-title":"Tech Mess"}],"event":{"name":"2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","location":"Limassol","start":{"date-parts":[[2017,9,12]]},"end":{"date-parts":[[2017,9,15]]}},"container-title":["2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8233358\/8247555\/08247756.pdf?arnumber=8247756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,11]],"date-time":"2022-08-11T20:27:51Z","timestamp":1660249671000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8247756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/etfa.2017.8247756","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}