{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,20]],"date-time":"2025-09-20T21:06:29Z","timestamp":1758402389304,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/etfa.2018.8502656","type":"proceedings-article","created":{"date-parts":[[2018,11,15]],"date-time":"2018-11-15T22:20:08Z","timestamp":1542320408000},"page":"800-807","source":"Crossref","is-referenced-by-count":2,"title":["Decentralized and Dynamic Fault Detection Using PCA and Bayesian Inference"],"prefix":"10.1109","author":[{"given":"A.","family":"Sanchez-Fernandez","sequence":"first","affiliation":[]},{"given":"M.J.","family":"Fuente","sequence":"additional","affiliation":[]},{"given":"G.I.","family":"Sainz-Palmero","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Fault detection in wastewater treatment plants using distributed pca methods","author":"sanchez-fern\u00e1ndez","year":"2015","journal-title":"2015 IEEE 20th Conference on Emerging Technologies Factory Automation (ETFA)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MED.2015.7158744"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2016.11.015"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICIF.2005.1591999"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2530047"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2008.0604"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/ie301945s"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/21.87068"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1995.10485888"},{"journal-title":"Statistical Methods in Control and Signal Processing","year":"1997","author":"larimore","key":"ref19"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"1627","DOI":"10.1016\/j.jprocont.2009.07.011","article-title":"Fault detection and diagnosis in process data using one-class support vector machines","volume":"19","author":"sankar","year":"2009","journal-title":"Journal of Process Control"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00058-7"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2014.12.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2010.05.014"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1016\/j.neucom.2016.03.007","article-title":"Differential feature based hierarchical PCA fault detection method for dynamic fault","volume":"202","author":"funa","year":"2016","journal-title":"Neurocomputing"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00012-1"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.02.003"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3182\/20140824-6-ZA-1003.02237"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2167110"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2033181"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.1996.11979699"},{"key":"ref20","first-page":"391","author":"wold","year":"1966","journal-title":"Estimation of Principal Components and Related Models by Iterative Least Squares"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(01)00155-1"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3168\/jds.2011-4647"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6849-3"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2009.00723.x"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"}],"event":{"name":"2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2018,9,4]]},"location":"Turin","end":{"date-parts":[[2018,9,7]]}},"container-title":["2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8488382\/8502441\/08502656.pdf?arnumber=8502656","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T12:48:32Z","timestamp":1643201312000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8502656\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/etfa.2018.8502656","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}