{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T05:42:19Z","timestamp":1725774139530},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/etfa.2019.8869071","type":"proceedings-article","created":{"date-parts":[[2019,10,17]],"date-time":"2019-10-17T23:18:52Z","timestamp":1571354332000},"page":"1653-1656","source":"Crossref","is-referenced-by-count":7,"title":["A Meta-Model for Representing Consistency as Extension to the Formal Process Description"],"prefix":"10.1109","author":[{"given":"Lukas","family":"Kathrein","sequence":"first","affiliation":[]},{"given":"Kristof","family":"Meixner","sequence":"additional","affiliation":[]},{"given":"Dietmar","family":"Winkler","sequence":"additional","affiliation":[]},{"given":"Arndt","family":"Luder","sequence":"additional","affiliation":[]},{"given":"Stefan","family":"Biffl","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"213","article-title":"Towards a test specification language for information systems: Focus on data entity and state machine tests","author":"da silva","year":"2018","journal-title":"MODELSWARD"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84882-067-8_2"},{"article-title":"Werkzeug für die formalisierte prozess-beschreibung vdi\/vde-richtlinie 3682 auf basis von ms visio®","year":"0","author":"christiansen","key":"ref12"},{"article-title":"Modellierungsvorschlag zur grafischen Beschreibung alternativer und paralleler Prozessabläufe auf Basis eines Vergleichs bestehender Beschreibungsmittel","year":"0","author":"christiansen","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2006.58"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-43839-8"},{"journal-title":"Ontology matchmaking of product ramp-up knowledge in manufacturing industries","year":"0","author":"willmann","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1515\/auto-2015-0015"},{"key":"ref6","article-title":"Product\/ion-Aware Modeling Languages that Support Tracing Design Decisions","author":"kathrein","year":"2019","journal-title":"Proc IEEE INDIN 2016"},{"journal-title":"VDI\/VDE 3682 Formalised process descriptions","year":"2005","key":"ref5"},{"journal-title":"UML Distilled A Brief Guide to the Standard Object Modeling Language","year":"2004","author":"fowler","key":"ref8"},{"key":"ref7","article-title":"Extending the Formal Process Description for Discrete Manufacturing","author":"kathrein","year":"2019","journal-title":"Technical Report CDL-SQI-2019-13"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-56345-9_1"},{"key":"ref1","first-page":"48","article-title":"Production-aware analysis of multi-disciplinary systems engineering processes","author":"kathrein","year":"2019","journal-title":"Proceedings of the 21st ICEIS Volume 2"},{"journal-title":"BPMN 2 0 Introduction to the Standard for Business Process Modeling","year":"2016","author":"allweyer","key":"ref9"}],"event":{"name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2019,9,10]]},"location":"Zaragoza, Spain","end":{"date-parts":[[2019,9,13]]}},"container-title":["2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8851311\/8868236\/08869071.pdf?arnumber=8869071","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:50:05Z","timestamp":1658155805000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8869071\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/etfa.2019.8869071","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}