{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T20:56:56Z","timestamp":1774645016901,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/etfa.2019.8869311","type":"proceedings-article","created":{"date-parts":[[2019,10,17]],"date-time":"2019-10-17T19:18:52Z","timestamp":1571339932000},"page":"1511-1514","source":"Crossref","is-referenced-by-count":22,"title":["A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks"],"prefix":"10.1109","author":[{"given":"Tobias","family":"Schlosser","sequence":"first","affiliation":[]},{"given":"Frederik","family":"Beuth","sequence":"additional","affiliation":[]},{"given":"Michael","family":"Friedrich","sequence":"additional","affiliation":[]},{"given":"Danny","family":"Kowerko","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2902657"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2004.09.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.visres.2011.04.012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/34.730558"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0734-189X(85)90016-7"},{"key":"ref15","article-title":"Very Deep Convolutional Networks for Large-Scale Image Recognition","author":"simonyan","year":"2015","journal-title":"International Conference on Learning Representations"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.990441"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1115\/1.4036239"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2006.07.011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/66.857947"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2676245"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-013-1442-7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2015.7159786"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.10.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2018.2795466"}],"event":{"name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","location":"Zaragoza, Spain","start":{"date-parts":[[2019,9,10]]},"end":{"date-parts":[[2019,9,13]]}},"container-title":["2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8851311\/8868236\/08869311.pdf?arnumber=8869311","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:50:06Z","timestamp":1658141406000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8869311\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/etfa.2019.8869311","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}