{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T08:50:13Z","timestamp":1765356613730,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/etfa.2019.8869359","type":"proceedings-article","created":{"date-parts":[[2019,10,17]],"date-time":"2019-10-17T19:18:52Z","timestamp":1571339932000},"page":"529-535","source":"Crossref","is-referenced-by-count":24,"title":["Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks"],"prefix":"10.1109","author":[{"given":"Julen","family":"Balzategui","sequence":"first","affiliation":[]},{"given":"Luka","family":"Eciolaza","sequence":"additional","affiliation":[]},{"given":"Nestor","family":"Arana-Arexolaleiba","sequence":"additional","affiliation":[]},{"given":"Jon","family":"Altube","sequence":"additional","affiliation":[]},{"given":"Jean-Philippe","family":"Aguerre","sequence":"additional","affiliation":[]},{"given":"Inaki","family":"Legarda-Ereno","sequence":"additional","affiliation":[]},{"given":"Aitor","family":"Apraiz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TII.2012.2209663"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1117\/12.380078"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"742","DOI":"10.1016\/j.patcog.2011.07.025","article-title":"Wavelet-based defect detection in solar wafer images with inhomogeneous texture","volume":"45","author":"li","year":"2012","journal-title":"Pattern Recognition"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.3724\/SP.J.1016.2013.01943"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.5194\/isprs-archives-XLII-2-893-2018"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/WACV.2018.00043"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.23919\/EUSIPCO.2018.8553025"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/978-3-319-91638-5_9"},{"key":"ref18","first-page":"91","article-title":"Faster r-cnn: Towards real-time object detection with region proposal networks","author":"ren","year":"2015","journal-title":"Proceedings of the 28th International Conference on Neural Information Processing Systems - Volume 1 ser NIPS’15"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/CAC.2018.8623082"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.jsamd.2017.05.005"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/IVS.2018.8500497"},{"key":"ref3","article-title":"Automatic classification of defective photovoltaic module cells in electroluminescence images","volume":"abs 1807 2894","author":"deitsch","year":"2018","journal-title":"CoRR"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1007\/s10845-018-1458-z"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.23940\/ijpe.17.07.p6.10481056"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1108\/02602281111110013"},{"year":"2018","author":"deitsch","article-title":"Segmentation of photovoltaic module cells in electroluminescence images","key":"ref7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.egypro.2012.07.125"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1186\/1687-5281-2014-15"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.egypro.2012.02.046"},{"year":"2018","author":"redmon","article-title":"Yolov3: An incremental improvement","key":"ref20"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/ICCV.2017.322"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1520\/SSMS20180033"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"3465","DOI":"10.1007\/s00170-017-0882-0","article-title":"A fast and robust convolutional neural network-based defect detection model in product quality control","volume":"94","author":"wang","year":"2018","journal-title":"International Journal of Advanced Manufacturing Technology"},{"year":"2018","author":"dong","article-title":"Small defect detection using convolutional neural network features and random forests","key":"ref23"},{"key":"ref26","article-title":"Lecture 6.5-rmsprop: Divide the gradient by a running average of its recent magnitude","author":"tieleman","year":"2012","journal-title":"Tech Rep"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1007\/978-3-319-94120-2_27"}],"event":{"name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2019,9,10]]},"location":"Zaragoza, Spain","end":{"date-parts":[[2019,9,13]]}},"container-title":["2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8851311\/8868236\/08869359.pdf?arnumber=8869359","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,21]],"date-time":"2023-09-21T16:33:51Z","timestamp":1695314031000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8869359\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/etfa.2019.8869359","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}