{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T13:55:28Z","timestamp":1752674128997},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/etfa46521.2020.9212026","type":"proceedings-article","created":{"date-parts":[[2020,10,5]],"date-time":"2020-10-05T21:37:37Z","timestamp":1601933857000},"page":"1419-1422","source":"Crossref","is-referenced-by-count":2,"title":["Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems"],"prefix":"10.1109","author":[{"given":"Francisco","family":"Arellano-Espitia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Artvin Darien","family":"Gonzalez-Abreu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miguel","family":"Delgado Prieto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juan Jose","family":"Saucedo-Dorantes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roque","family":"Alfredo Osornio-Rios","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIA.2016.2637307"},{"key":"ref3","first-page":"2111","article-title":"Statistical data fusion as diagnosis scheme applied to a kinematic chain","author":"arellano","year":"2018","journal-title":"Proc IEEE Int Conf Ind Technol (ICIT)"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TIM.2017.2759418"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ETFA.2014.7005106"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1155\/2017\/3583610"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ETFA.2017.8247663"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.ymssp.2016.08.019"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1016\/j.ymssp.2018.05.050"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ETFA.2014.7005208"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/ICElMach.2012.6350079"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TPEL.2015.2499774"}],"event":{"name":"2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2020,9,8]]},"location":"Vienna, Austria","end":{"date-parts":[[2020,9,11]]}},"container-title":["2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9210104\/9211869\/09212026.pdf?arnumber=9212026","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:39:21Z","timestamp":1656344361000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9212026\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/etfa46521.2020.9212026","relation":{},"subject":[],"published":{"date-parts":[[2020,9]]}}}