{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T19:49:45Z","timestamp":1725306585521},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/etfa46521.2020.9212064","type":"proceedings-article","created":{"date-parts":[[2020,10,5]],"date-time":"2020-10-05T21:37:37Z","timestamp":1601933857000},"source":"Crossref","is-referenced-by-count":7,"title":["PoseNetwork: Pipeline for the Automated Generation of Synthetic Training Data and CNN for Object Detection, Segmentation, and Orientation Estimation"],"prefix":"10.1109","author":[{"given":"Alejandro","family":"Magana","sequence":"first","affiliation":[]},{"given":"Hang","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Philipp","family":"Bauer","sequence":"additional","affiliation":[]},{"given":"Gunther","family":"Reinhart","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1007\/978-3-319-46448-0_2","article-title":"SSD: Single Shot MultiBox Detector","author":"liu","year":"2016","journal-title":"Computer Vision – ECCV 2016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref14","first-page":"1990","article-title":"Learning to segment object candidates","author":"pinheiro","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2017.103"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2017.8202206"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.18"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2017.8202133"},{"key":"ref19","first-page":"969","article-title":"Training deep networks with synthetic data: Bridging the reality gap by domain randomization","author":"tremblay","year":"2018","journal-title":"Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01231-1_43"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.366"},{"key":"ref6","author":"goodfellow","year":"2016","journal-title":"Deep Learning"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.15607\/RSS.2018.XIV.019"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.413"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.336"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.169"},{"key":"ref1","article-title":"World robotics industrial robots report 2018","year":"2018","journal-title":"S D hosted by VDMA Robotics and A Germany"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10605-2_35"},{"key":"ref20","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"International Conference on Learning Representations"}],"event":{"name":"2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","location":"Vienna, Austria","start":{"date-parts":[[2020,9,8]]},"end":{"date-parts":[[2020,9,11]]}},"container-title":["2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9210104\/9211869\/09212064.pdf?arnumber=9212064","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:39:22Z","timestamp":1656344362000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9212064\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/etfa46521.2020.9212064","relation":{},"subject":[],"published":{"date-parts":[[2020,9]]}}}