{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T21:39:37Z","timestamp":1725658777584},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,6]]},"DOI":"10.1109\/etfa52439.2022.9921606","type":"proceedings-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T19:02:42Z","timestamp":1667502162000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["TOLERANCER: A Fault Tolerance Approach for Cloud Manufacturing Environments"],"prefix":"10.1109","author":[{"given":"Auday","family":"Al-Dulaimy","sequence":"first","affiliation":[{"name":"Mälardalen University,Sweden"}]},{"given":"Christian","family":"Sicari","sequence":"additional","affiliation":[{"name":"University of Messina,Italy"}]},{"given":"Alessandro V.","family":"Papadopoulos","sequence":"additional","affiliation":[{"name":"Mälardalen University,Sweden"}]},{"given":"Antonino","family":"Galletta","sequence":"additional","affiliation":[{"name":"University of Messina,Italy"}]},{"given":"Massimo","family":"Villari","sequence":"additional","affiliation":[{"name":"University of Messina,Italy"}]},{"given":"Mohammad","family":"Ashjaei","sequence":"additional","affiliation":[{"name":"Mälardalen University,Sweden"}]}],"member":"263","event":{"name":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2022,9,6]]},"location":"Stuttgart, Germany","end":{"date-parts":[[2022,9,9]]}},"container-title":["2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9921412\/9921279\/09921606.pdf?arnumber=9921606","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,14]],"date-time":"2022-11-14T17:08:13Z","timestamp":1668445693000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9921606\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,6]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/etfa52439.2022.9921606","relation":{},"subject":[],"published":{"date-parts":[[2022,9,6]]}}}