{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T11:14:30Z","timestamp":1725707670857},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,6]]},"DOI":"10.1109\/etfa52439.2022.9921640","type":"proceedings-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T23:02:42Z","timestamp":1667516562000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["An Evaluation Framework for Vision-in-the-Loop Motion Control Systems"],"prefix":"10.1109","author":[{"given":"Chaitanya","family":"Jugade","sequence":"first","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Hartgers","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Phan Duc","family":"Anh","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sajid","family":"Mohamed","sequence":"additional","affiliation":[{"name":"ITEC B. V.,Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mojtaba","family":"Haghi","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dip","family":"Goswami","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrew","family":"Nelson","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gijs","family":"van der Veen","sequence":"additional","affiliation":[{"name":"ITEC B. V.,Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kees","family":"Goossens","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology (TU\/e),Department of Electrical Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2021.100432"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2012.2182859"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/app11188337"},{"key":"ref4","article-title":"Digital Twins and AI in Smart Motion Control Applications","volume-title":"Emerging Technologies and Factory Automation (ETFA)","author":"\u010cech","year":"2022"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3103051"},{"key":"ref6","first-page":"491","volume-title":"NoC-Based Multiprocessor Architecture for Mixed-Time-Criticality Applications","author":"Goossens","year":"2017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2019.8814430"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MECO.2019.8760055"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3023047"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2020.103037"},{"key":"ref11","first-page":"1","article-title":"How learning control supports industry 4.0 in semiconductor manufacturing","author":"van der Veen","year":"2020","journal-title":"ASPE Spring Topical Meeting on Design and Control of Precision Mechatronic Systems"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2014.2385600"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2019.00090"}],"event":{"name":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2022,9,6]]},"location":"Stuttgart, Germany","end":{"date-parts":[[2022,9,9]]}},"container-title":["2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9921412\/9921279\/09921640.pdf?arnumber=9921640","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T06:12:58Z","timestamp":1706076778000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9921640\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/etfa52439.2022.9921640","relation":{},"subject":[],"published":{"date-parts":[[2022,9,6]]}}}