{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T13:07:26Z","timestamp":1763644046499,"version":"3.37.3"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100009950","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,12]]},"DOI":"10.1109\/etfa54631.2023.10275464","type":"proceedings-article","created":{"date-parts":[[2023,10,12]],"date-time":"2023-10-12T17:38:14Z","timestamp":1697132294000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Enabling Fault Diagnosis in Skill-Based Production Environments"],"prefix":"10.1109","author":[{"given":"Pascal","family":"R\u00fcbel","sequence":"first","affiliation":[{"name":"German Research Center for Artificial Intelligence (DFKI),Kaiserslautern,Germany"}]},{"given":"Nastaran","family":"Moarefvand","sequence":"additional","affiliation":[{"name":"German Research Center for Artificial Intelligence (DFKI),Kaiserslautern,Germany"}]},{"given":"William","family":"Motsch","sequence":"additional","affiliation":[{"name":"Techologie-Initiative SmartFactory KL e.V.,Kaiserslautern,Germany"}]},{"given":"Achim","family":"Wagner","sequence":"additional","affiliation":[{"name":"German Research Center for Artificial Intelligence (DFKI),Kaiserslautern,Germany"}]},{"given":"Martin","family":"Ruskowski","sequence":"additional","affiliation":[{"name":"German Research Center for Artificial Intelligence (DFKI),Kaiserslautern,Germany"}]}],"member":"263","reference":[{"article-title":"Information Model for Capabilities, Skills & Services","year":"2022","author":"diedrich","key":"ref13"},{"key":"ref35","first-page":"1","article-title":"Towards a better understanding of context and context-awareness","volume":"4","author":"dey","year":"2000","journal-title":"Proceedings of the CHI 2000 Workshop on The What Who Where When and How of Context Awareness"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1162\/152417302762251336"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2022.09.080"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.06.005"},{"key":"ref37","first-page":"71","article-title":"A Schema-First Formalism for Labeled Property Graph Databases","author":"sharma","year":"2019","journal-title":"Kenneth Johnson Josef Spillner Xinghui Zhao Olga Datskova and Blesson Varghese (Edtrs) Proceedings of the 6th IEEE\/ACM International Conference on Big Data Computing Applications and Technologies - BDCAT ’19 the 6th IEEE\/ACM International Conference Auckland New Zealand 02 12 2019 - 05 12 2019"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"94","DOI":"10.1515\/auto-2022-0117","article-title":"A reference model for common understanding of capabilities and skills in manufacturing","volume":"71","author":"k\u00f6cher","year":"2023","journal-title":"at - Automatisierungstechnik"},{"key":"ref36","first-page":"37","article-title":"Editorial—Journal of Web Semantics-Volumes 37-38","author":"kr\u00f6tzsch","year":"2016","journal-title":"Journal of Web Semantics"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/asi5050098"},{"year":"2005","key":"ref30","article-title":"Formalized Process Description Guideline"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2021.03.041"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3307363.3307381"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.54097\/ajst.v5i1.5664"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"291","DOI":"10.1016\/j.promfg.2020.01.038","article-title":"Self-description of cyber-physical production modules for a product-driven manufacturing system","volume":"38","author":"hermann","year":"2019","journal-title":"Procedia Manufacturing"},{"journal-title":"Recommendations for Implementing the Strategic Initiative INDUSTRIE 4 0 Final Report of the Industrie 4 0 Working Group","year":"2013","author":"kagermann","key":"ref1"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.51202\/9783186705020"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.17560\/atp.v65i6-7.2672"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2016.12.165"},{"journal-title":"IEC 56\/1579\/CD 2014","article-title":"Fehlzustandsart- und -auswirkungsanalyse (FMEA)","year":"2015","key":"ref38"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA45728.2021.9613306"},{"article-title":"Describing Capabilities of Industrie 4.0 Components","year":"2019","author":"bayha","key":"ref18"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2020.01.244"},{"key":"ref23","first-page":"1","article-title":"An ontology for integrated machining and inspection process planning focusing on resource capabilities","author":"solano","year":"2019","journal-title":"International Journal of Computer Integrated Manufacturing"},{"key":"ref26","first-page":"4119","article-title":"On the Diagnosis of Cyber-Physical Productions Systems: State-of-the-Art and Research Agenda","author":"niggemann","year":"2015","journal-title":"Proceedings of the Twenty-Ninth AAAI Conference on Artificial Intelligence"},{"year":"0","key":"ref25","article-title":"Industrial automation systems and integration - Industrial manufacturing management data - Part 31: Resource information mode"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2013.6648114"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISAM.2016.7750724"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2009.5347260"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3233\/SW-233481"},{"key":"ref27","article-title":"First Approaches to Automatically Diagnose and Reconfigure Hybrid Cyber-Physical Systems","author":"diedrich","year":"2020","journal-title":"ML4CPS 2020 – Machine Learning for Cyber Physical Systems"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2014.7005098"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.36001\/phmconf.2021.v13i1.2983"},{"journal-title":"Fault-Diagnosis Systems An Introduction from Fault Detection to Fault Tolerance","year":"2006","author":"isermann","key":"ref7"},{"key":"ref9","first-page":"4119","article-title":"On the Diagnosis of Cyber-Physical Production Systems: State-of-the-Art and Research Agenda","author":"niggemann","year":"2015","journal-title":"Proceedings of the Twenty-Ninth AAAI Conference on Artifical Intelligence"},{"key":"ref4","article-title":"Production Level 4 - Der Weg zur zukunftssicheren und verlässlichen Produktion","author":"bergweiler","year":"2022","journal-title":"Whitepaper SF-5 1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.17560\/atp.v62i9.2505"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2004.12.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(97)00053-1"}],"event":{"name":"2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2023,9,12]]},"location":"Sinaia, Romania","end":{"date-parts":[[2023,9,15]]}},"container-title":["2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10275065\/10275329\/10275464.pdf?arnumber=10275464","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T18:44:33Z","timestamp":1698691473000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10275464\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,12]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/etfa54631.2023.10275464","relation":{},"subject":[],"published":{"date-parts":[[2023,9,12]]}}}