{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T14:36:42Z","timestamp":1762353402071,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,12]]},"DOI":"10.1109\/etfa54631.2023.10275603","type":"proceedings-article","created":{"date-parts":[[2023,10,12]],"date-time":"2023-10-12T13:38:14Z","timestamp":1697117894000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A Mutual-Information based Transfer Suitability Metric for Industrial Control"],"prefix":"10.1109","author":[{"given":"Jose Lopez","family":"Vicario","sequence":"first","affiliation":[{"name":"Universitat Autonoma de Barcelona,Wireless Information Networking (WIN) Escola d’Enginyeria,Bellaterra,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ivan","family":"Pisa","sequence":"additional","affiliation":[{"name":"Universitat Oberta de Catalunya,Wireless Networks Research Lab (WINE),Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antoni","family":"Morell","sequence":"additional","affiliation":[{"name":"Universitat Autonoma de Barcelona,Wireless Information Networking (WIN) Escola d’Enginyeria,Bellaterra,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramon","family":"Vilanova","sequence":"additional","affiliation":[{"name":"Universitat Autonoma de Barcelona,Automation and Advanced Control Systems (ASAC) Escola d’Enginyeria,Bellaterra,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2020.03.015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/app9163220"},{"journal-title":"Deep Learning","year":"2016","author":"goodfellow","key":"ref14"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITW.2015.7133169"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2023.02.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.08.012"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1109\/JPROC.2020.3004555","article-title":"A comprehensive survey on transfer learning","volume":"109","author":"zhuang","year":"2020","journal-title":"Proceedings of the IEEE"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-64580-9_32"},{"key":"ref7","article-title":"How transferable are features in deep neural networks?","volume":"27","author":"yosinski","year":"2014","journal-title":"Advances in neural information processing systems"},{"article-title":"On metrics to assess the transferability of machine learning models in non-intrusive load monitoring","year":"2019","author":"klemenjak","key":"ref9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s21030823"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2864759"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"6315","DOI":"10.3390\/s21186315","article-title":"Transfer Learning in Wastewater Treatment Plant Control Design: From Conventional to Long Short-Term Memory-Based Controllers","volume":"21","author":"pisa","year":"2021","journal-title":"SENSORS"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA45728.2021.9613360"}],"event":{"name":"2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2023,9,12]]},"location":"Sinaia, Romania","end":{"date-parts":[[2023,9,15]]}},"container-title":["2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10275065\/10275329\/10275603.pdf?arnumber=10275603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T14:44:40Z","timestamp":1698677080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10275603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,12]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/etfa54631.2023.10275603","relation":{},"subject":[],"published":{"date-parts":[[2023,9,12]]}}}