{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T10:48:13Z","timestamp":1761130093361,"version":"3.37.3"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T00:00:00Z","timestamp":1694476800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002701","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002701","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,12]]},"DOI":"10.1109\/etfa54631.2023.10275612","type":"proceedings-article","created":{"date-parts":[[2023,10,12]],"date-time":"2023-10-12T17:38:14Z","timestamp":1697132294000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Integration of Domain Expert-Centric Ontology Design into the CRISP-DM for Cyber-Physical Production Systems"],"prefix":"10.1109","author":[{"given":"Milapji Singh","family":"Gill","sequence":"first","affiliation":[{"name":"Helmut-Schmidt-University,Institute of Automation Technology,Hamburg,Germany"}]},{"given":"Tom","family":"Westermann","sequence":"additional","affiliation":[{"name":"Helmut-Schmidt-University,Institute of Automation Technology,Hamburg,Germany"}]},{"given":"Marvin","family":"Schieseck","sequence":"additional","affiliation":[{"name":"Helmut-Schmidt-University,Institute of Automation Technology,Hamburg,Germany"}]},{"given":"Alexander","family":"Fay","sequence":"additional","affiliation":[{"name":"Helmut-Schmidt-University,Institute of Automation Technology,Hamburg,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISAM.2016.7750724"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2020.114060"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2991777"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2018.8560465"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2020.0368"},{"journal-title":"VDI\/VDE3714-1","article-title":"Implementation and operation of big data application in the manufacturing industry - implementation of big data projects","year":"2022","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICOSC.2015.7050814"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/BigData.2018.8622364"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1609\/aimag.v17i3.1230"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2388958"},{"author":"Wirth","key":"ref11","article-title":"CRISP-DM; Towards a Standard Process Model for Data Mining"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2019.02.106"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/INES52918.2021.9512899"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2596101"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA52439.2022.9921489"},{"volume-title":"CASP-DM: Context Aware Standard Process for Data Mining","year":"2017","author":"Mart\u00ednez-Plumed","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/BigData52589.2021.9671634"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2021.01.199"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.websem.2021.100664"},{"article-title":"An ontology-based approach to data cleaning","year":"2005","author":"Wang","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA52439.2022.9921565"},{"article-title":"RML: A Generic Language for Integrated RDF Mappings of Heterogeneous Data","year":"2014","author":"Dimou","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3340531.3412881"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3233\/sw-160217"},{"year":"2023","key":"ref25","article-title":"Homepage - ecl@ss"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v29i1.9762"},{"article-title":"Identification of timed behavior models for diagnosis in production systems","volume-title":"26th International Workshop on Principles of Diagnosis (DX-2015)","author":"Maier","key":"ref27"}],"event":{"name":"2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2023,9,12]]},"location":"Sinaia, Romania","end":{"date-parts":[[2023,9,15]]}},"container-title":["2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10275065\/10275329\/10275612.pdf?arnumber=10275612","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T08:34:56Z","timestamp":1709368496000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10275612\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,12]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/etfa54631.2023.10275612","relation":{},"subject":[],"published":{"date-parts":[[2023,9,12]]}}}