{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T22:37:16Z","timestamp":1761172636134,"version":"build-2065373602"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,9]]},"DOI":"10.1109\/etfa65518.2025.11205577","type":"proceedings-article","created":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:07:47Z","timestamp":1761066467000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Digital Transformation in HPDC: Maintenance Forecasting and Remaining Useful Life of Die"],"prefix":"10.1109","author":[{"given":"Analucia S.","family":"Morales","sequence":"first","affiliation":[{"name":"Federal University of Santa Catarina (UFSC),Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Patricia","family":"Plentz","sequence":"additional","affiliation":[{"name":"Federal University of Santa Catarina (UFSC),Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lucas","family":"Bertinetti","sequence":"additional","affiliation":[{"name":"Federal University of Santa Catarina (UFSC),Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heinz F. C.","family":"Rahmig","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marcos G.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Demostenes F.","family":"Filho","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Emilio","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thaynara","family":"Mabille","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renato","family":"Bulc\u00e3o","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iwens","family":"Sene","sequence":"additional","affiliation":[{"name":"Federal University of Goias (UFG),Advanced Knowledge Center in Immersive Technology, Center of Excellence in Artificial Intelligence (CEIA) - Institute of Informatics,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02057-1"},{"issue":"7","key":"ref2","article-title":"Casting process improvement by the application of artificial intelligence","volume-title":"Applied Sciences","volume":"12","author":"Du\u010di\u0107","year":"2022"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2020.116972"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jma.2023.11.003"},{"key":"ref5","article-title":"System understanding of high pressure die casting process and data with machine learning applications","volume-title":"Ph.D. dissertation","author":"Blondheim","year":"2021"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/02533839.2023.2204880"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-023-00947-9"},{"issue":"13","key":"ref8","article-title":"Surface defect detection of preform based on improved yolov5","volume-title":"Applied Sciences","volume":"13","author":"Hou","year":"2023"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3168309"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/pr11102947"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194175"},{"issue":"10","key":"ref12","article-title":"High-pressure die casting: A review of progress from the epsrc future lime hub","volume-title":"Metals","volume":"12","author":"Lordan","year":"2022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s40962-023-01252-x"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/ma17235935"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-008-1559-5"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-015-1333-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s12633-020-00594-z"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s11668-024-02027-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/920865"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2020.09.139"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/1256\/1\/012028"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2022.12.364"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.12700\/APH.10.03.2013.3.6"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2023.107383"},{"issue":"1","key":"ref25","first-page":"9","article-title":"Thermal fatigue cracking of die-casting dies","volume":"49","author":"Muhi\u010d","year":"2010","journal-title":"Metalurgija"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2023.118131"},{"key":"ref27","article-title":"The music guide to key-parameters in high pressure die casting","author":"Bonollo","year":"2014","journal-title":"Tech. Rep."},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1186\/s10033-019-0317-y"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1541880.1541882"},{"key":"ref30","first-page":"24824","article-title":"Chain-of-thought prompting elicits reasoning in large language models","volume":"35","author":"Wei","year":"2022","journal-title":"Advances in neural information processing systems"},{"article-title":"Efficient estimation of word representations in vector space","year":"2013","author":"Mikolov","key":"ref31"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/D19-1410"}],"event":{"name":"2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2025,9,9]]},"location":"Porto, Portugal","end":{"date-parts":[[2025,9,12]]}},"container-title":["2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11205475\/11205526\/11205577.pdf?arnumber=11205577","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T05:21:24Z","timestamp":1761110484000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11205577\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,9]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/etfa65518.2025.11205577","relation":{},"subject":[],"published":{"date-parts":[[2025,9,9]]}}}