{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T22:36:14Z","timestamp":1761172574835,"version":"build-2065373602"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,9]]},"DOI":"10.1109\/etfa65518.2025.11205707","type":"proceedings-article","created":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:07:47Z","timestamp":1761066467000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["On the Impact of Instance- and Type-Level Modeling on Neural Network-Based Anomaly Detection for Cyber-Physical Systems"],"prefix":"10.1109","author":[{"given":"Daniel","family":"Vranje\u0161","sequence":"first","affiliation":[{"name":"Helmut Schmidt University,Institute for Artificial Intelligence,Hamburg,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oliver","family":"Niggemann","sequence":"additional","affiliation":[{"name":"Helmut Schmidt University,Institute for Artificial Intelligence,Hamburg,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"article-title":"Vdi\/vde 3682 blatt 1 - formalised process descriptions - concept and graphic representation","year":"2015","author":"Ingenieure","key":"ref1"},{"year":"2016","key":"ref2","article-title":"Iec 62424:2016 representation of process control engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.5937\/fmet1904663P"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10696-019-09338-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2017.12.106"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1109\/ETFA61755.2024.10710647","article-title":"Extracting knowledge using machine learning for anomaly detection and root-cause diagnosis","volume-title":"IEEE ETFA 2024 - IEEE International Conference on Emerging Technologies and Factory Automation","author":"Moddemann"},{"key":"ref7","first-page":"1","article-title":"Enhancing cyber-physical system analysis with structure-aware modular neural networks","volume-title":"2024 IEEE 7th International Conference on Industrial Cyber-Physical Systems (ICPS)","author":"Vranje\u0161"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA61755.2024.10711115"},{"key":"ref9","first-page":"363","article-title":"Cyber physical systems : Design challenges university of california, berkeley","volume-title":"Distributed Computing","author":"Lee","year":"2008"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-32156-1_5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref12","first-page":"1","article-title":"Anomaly detection","volume-title":"ACM Computing Surveys (CSUR)","volume":"14","author":"Prasad","year":"2009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3216007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.14778\/3538598.3538602"},{"key":"ref15","first-page":"3283","article-title":"A review of anomaly detection strategies to detect threats to cyber-physical systems","volume-title":"Electronics 2023, Vol. 12, Page 3283","volume":"12","author":"Jeffrey","year":"2023"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3349132"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3105827"},{"key":"ref18","doi-asserted-by":"crossref","DOI":"10.36001\/phmconf.2023.v15i1.3444","article-title":"A comparison of residual-based methods on fault detection","volume-title":"Proceedings of the Annual Conference of the PHM Society 2023","author":"Hsu"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2020.3007880"},{"key":"ref20","first-page":"39","article-title":"Neural module networks","volume-title":"Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition","volume":"2016-December","author":"Andreas"},{"article-title":"Learning to control self-assembling morphologies: A study of generalization via modularity","volume-title":"Advances in Neural Information Processing Systems 32 (NeurIPS 2019)","author":"Pathak","key":"ref21"},{"key":"ref22","article-title":"Modularity as a means for complexity management in neural networks learning","volume-title":"Proceedings of the AAAI 2019 Spring Symposium on Combining Machine Learning with Knowledge Engineering (AAAI-MAKE 2019)","volume":"2350","author":"Castillo-Bolado"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00047"},{"key":"ref24","article-title":"Learning multiple visual domains with residual adapters","volume":"30","author":"Rebuffi","year":"2017","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-020-01090-5"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1126\/science.1127647"},{"key":"ref27","first-page":"29","article-title":"The meaning and use of the area under a receiver operating characteristic (roc) curve","volume-title":"Radiology","volume":"143","author":"Hanley","year":"1982"},{"key":"ref28","first-page":"1285","article-title":"Measuring the accuracy of diagnostic systems","volume-title":"Science (New York, N.Y.)","volume":"240","author":"Swets","year":"1988"},{"key":"ref29","first-page":"307","article-title":"An introduction to variational autoencoders","volume-title":"Foundations and Trends in Machine Learning","volume":"12","author":"Kingma","year":"2019"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1390156.1390294"}],"event":{"name":"2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2025,9,9]]},"location":"Porto, Portugal","end":{"date-parts":[[2025,9,12]]}},"container-title":["2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11205475\/11205526\/11205707.pdf?arnumber=11205707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T05:17:50Z","timestamp":1761110270000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11205707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,9]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/etfa65518.2025.11205707","relation":{},"subject":[],"published":{"date-parts":[[2025,9,9]]}}}