{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T22:42:24Z","timestamp":1761172944439,"version":"build-2065373602"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T00:00:00Z","timestamp":1757376000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,9]]},"DOI":"10.1109\/etfa65518.2025.11205712","type":"proceedings-article","created":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:07:47Z","timestamp":1761066467000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["IIoT portable laser line profilometer powered by AI for gap and flush measurement in automotive"],"prefix":"10.1109","author":[{"given":"Cristina","family":"Cristalli","sequence":"first","affiliation":[{"name":"U-Sense.It Srl,Jesi,AN,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matteo","family":"Nisi","sequence":"additional","affiliation":[{"name":"U-Sense.It Srl,Jesi,AN,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Chiariotti","sequence":"additional","affiliation":[{"name":"Politecnico di Milano,Department of Mechanical Egineering,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emanuele","family":"Lattanzi","sequence":"additional","affiliation":[{"name":"University of Urbino,Department of Pure and Applied Sciences,Urbino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicola","family":"Paone","sequence":"additional","affiliation":[{"name":"Università Politecnica Delle Marche,Dept. of Industrial Engineering and Mathematical Sciences,Ancona,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103596"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/indin.2018.8472016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2024.2388217"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEM.2024.3479775"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s12555-017-0535-y"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3199066"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1589\/1\/012017"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s20113300"},{"volume-title":"H2020 GO0DMAN project: aGent Oriented Zero Defect Multi-stage mANufacturing","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/metroind4.0iot48571.2020.9138222"},{"volume-title":"WO2019167012A1 Sistema di misura di gap e flush","year":"2018","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-41501-7_50"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.2992971"},{"volume-title":"HORIZON EUROPE Project openZDM: Open platform for realizing zero defects in cyber physical manufacturing","key":"ref14"},{"volume-title":"Apparatus, method and computer program for measuring a space and \/ or an alignment and \/ or an angle of misalignment between a first surface and a second surface","year":"2024","key":"ref15"},{"key":"ref16","first-page":"234","article-title":"U-net: Convolutional networks for biomedical image segmentation. In Medical image computing and computer-assisted intervention","volume-title":"MICCAI 2015: 18th international conference, Munich, Germany, October 5-9, 2015, proceedings, part III 18","author":"Ronneberger"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/vcip.2017.8305148"}],"event":{"name":"2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)","start":{"date-parts":[[2025,9,9]]},"location":"Porto, Portugal","end":{"date-parts":[[2025,9,12]]}},"container-title":["2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11205475\/11205526\/11205712.pdf?arnumber=11205712","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T05:39:55Z","timestamp":1761111595000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11205712\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,9]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/etfa65518.2025.11205712","relation":{},"subject":[],"published":{"date-parts":[[2025,9,9]]}}}