{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:54:26Z","timestamp":1730220866545,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/ets.2012.6233011","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T23:41:10Z","timestamp":1342741270000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Characterization and handling of low-cost micro-architectural signatures in MPSoCs"],"prefix":"10.1109","author":[{"given":"Armin","family":"Krieg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Johannes","family":"Grinschgl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Steger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Reinhold","family":"Weiss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andreas","family":"Genser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Holger","family":"Bock","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Josef","family":"Haid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5955001"},{"journal-title":"CRC Generator","year":"2011","key":"22"},{"key":"17","article-title":"Detecting emerging wearout faults","author":"smolens","year":"2007","journal-title":"SELSE"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1145\/1037947.1024420"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364391"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2053856"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(01)00090-8"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/1086297.1086337"},{"key":"11","first-page":"483","article-title":"Hardware support for secure processing in embedded systems","author":"mao","year":"2007","journal-title":"DAC ACM"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPSW.2010.5470728"},{"journal-title":"Hash Functions for Hash Table Lookup","year":"2011","author":"jenkins","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993849"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.266"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2010.38"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1393921.1394010"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/12.588046"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"6","first-page":"137","article-title":"Low-cost on-line fault detection using control flow assertions","author":"venkatasubramanian","year":"2003","journal-title":"IEEE On-Line Testing Symposium 2003"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1999.802887"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676637"},{"key":"8","first-page":"389","article-title":"A concurrent test technique for standard microprocessors","volume":"83","author":"daniels","year":"1983","journal-title":"Digest of Papers Compcon Spring"}],"event":{"name":"2012 17th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2012,5,28]]},"location":"Annecy, France","end":{"date-parts":[[2012,5,31]]}},"container-title":["2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222773\/6232988\/06233011.pdf?arnumber=6233011","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:25:43Z","timestamp":1490113543000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6233011\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/ets.2012.6233011","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}