{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:15:19Z","timestamp":1725484519734},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/ets.2012.6233013","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T23:41:10Z","timestamp":1342741270000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["OBT for settling error test of sampled-data systems using signal-dependent clocking"],"prefix":"10.1109","author":[{"given":"Manuel J.","family":"Barragan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gildas","family":"Leger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jose L.","family":"Huertas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541419"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386959"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2046956"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510896"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2010.67"},{"key":"1","first-page":"17","article-title":"Production test challenges for highly integrated mobile phone SOCs; A case study","author":"poehl","year":"2010","journal-title":"Test Symposium (ETS)"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299267"},{"journal-title":"Oscillation-Based Test in Mixed-Signal Circuits","year":"2006","author":"huertas","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2000.812668"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/4.663562"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582381"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2031381"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2006648"}],"event":{"name":"2012 17th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2012,5,28]]},"location":"Annecy, France","end":{"date-parts":[[2012,5,31]]}},"container-title":["2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222773\/6232988\/06233013.pdf?arnumber=6233013","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:25:45Z","timestamp":1490113545000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6233013\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ets.2012.6233013","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}