{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T21:14:59Z","timestamp":1725398099857},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/ets.2012.6233022","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T19:41:10Z","timestamp":1342726870000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Indirect method for random jitter measurement on SoCs using critical path characterization"],"prefix":"10.1109","author":[{"family":"Jae Wook Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ji Hwan Chun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2005.1466532"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012742"},{"key":"13","first-page":"518","article-title":"The value of tester accuracy","author":"dalal","year":"1999","journal-title":"Test Conference 1999 Proceedings International"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805809"},{"key":"11","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2006.297642","article-title":"Power supply noise in delay testing","author":"wang","year":"2006","journal-title":"Test Conference 2006"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2011.942067"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.23"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2006476"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2052377"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364663"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/43.848085"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232251"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557162"},{"journal-title":"OR1200 OpenRISC Processor","year":"2012","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557126"}],"event":{"name":"2012 17th IEEE European Test Symposium","start":{"date-parts":[[2012,5,28]]},"location":"Annecy","end":{"date-parts":[[2012,5,31]]}},"container-title":["2012 17th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222773\/6232988\/06233022.pdf?arnumber=6233022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T17:37:47Z","timestamp":1497980267000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6233022\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ets.2012.6233022","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}