{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:09:46Z","timestamp":1725559786883},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/ets.2012.6233044","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T23:41:10Z","timestamp":1342741270000},"page":"1-1","source":"Crossref","is-referenced-by-count":3,"title":["Embedded synthetic instruments for Board-Level testing"],"prefix":"10.1109","author":[{"given":"Artur","family":"Jutman","sequence":"first","affiliation":[]},{"given":"Sergei","family":"Devadze","sequence":"additional","affiliation":[]},{"given":"Igor","family":"Aleksejev","sequence":"additional","affiliation":[]},{"given":"Thomas","family":"Wenzel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"116","DOI":"10.1109\/AUTEST.2006.283667","article-title":"LXI: A shift in the functional test paradigm","author":"semancik","year":"2006","journal-title":"Proc of IEEE Autotestcon 2006"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2006.311281"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355668"},{"key":"5","article-title":"Embedded system access: Changing the paradigm of electrical test","author":"wenzel","year":"2012","journal-title":"White Paper Goepel Electronic"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.86"}],"event":{"name":"2012 17th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2012,5,28]]},"location":"Annecy, France","end":{"date-parts":[[2012,5,31]]}},"container-title":["2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222773\/6232988\/06233044.pdf?arnumber=6233044","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T21:37:47Z","timestamp":1497994667000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6233044\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/ets.2012.6233044","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}