{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T21:21:00Z","timestamp":1774473660497,"version":"3.50.1"},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/ets.2012.6233048","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T19:41:10Z","timestamp":1342726870000},"page":"1-1","source":"Crossref","is-referenced-by-count":7,"title":["The impact of functional safety standards in the design and test of reliable and available integrated circuits"],"prefix":"10.1109","author":[{"given":"Riccardo","family":"Mariani","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"3","year":"0","journal-title":"ISO\/IS 26262-1\/9 2011(E) and ISO\/FDIS 26262-10 2012(E)"},{"key":"2","year":"0","journal-title":"IEC 61508-1\/7 2010"},{"key":"1","author":"tahne","year":"1996","journal-title":"Safe and Reliable Computer Control Systems Concepts and Methods"}],"event":{"name":"2012 17th IEEE European Test Symposium (ETS)","location":"Annecy, France","start":{"date-parts":[[2012,5,28]]},"end":{"date-parts":[[2012,5,31]]}},"container-title":["2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222773\/6232988\/06233048.pdf?arnumber=6233048","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T12:05:59Z","timestamp":1490097959000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6233048\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ets.2012.6233048","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}