{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:36:11Z","timestamp":1729672571850,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/ets.2013.6569354","type":"proceedings-article","created":{"date-parts":[[2013,8,2]],"date-time":"2013-08-02T17:16:01Z","timestamp":1375463761000},"page":"1-7","source":"Crossref","is-referenced-by-count":25,"title":["Scan pattern retargeting and merging with reduced access time"],"prefix":"10.1109","author":[{"given":"Rafal","family":"Baranowski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael A.","family":"Kochte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"102","article-title":"A case study of using ieee P1687 (IJTAG) for high-speed serial i\/o characterization and testing","author":"rearick","year":"2006","journal-title":"Proc IEEE International Test Conference (ITC)"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219013"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-72200-7_23"},{"key":"1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-7563-8","author":"stollon","year":"2011","journal-title":"On-Chip Instrumentation Design and Debug for Systems on Chip"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.155"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401555"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.74"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763228"},{"key":"9","first-page":"1","article-title":"Multi-criteria optimization in answer set programming","volume":"11","author":"gebser","year":"2011","journal-title":"Technical Communications of the Int'l Conf on Logic Programming (ICLP) Ser LIPIcs"},{"key":"8","doi-asserted-by":"crossref","first-page":"1","DOI":"10.3233\/SAT190014","article-title":"Translating pseudo-boolean constraints into sat","volume":"2","author":"e?en","year":"2006","journal-title":"Journal on Satisfiability Boolean Modeling and Computation"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041802"}],"event":{"name":"2013 18th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2013,5,27]]},"location":"Avignon, France","end":{"date-parts":[[2013,5,30]]}},"container-title":["2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6558538\/6569335\/06569354.pdf?arnumber=6569354","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T06:27:38Z","timestamp":1596263258000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6569354\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ets.2013.6569354","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}