{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:30:33Z","timestamp":1725514233064},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/ets.2013.6569363","type":"proceedings-article","created":{"date-parts":[[2013,8,2]],"date-time":"2013-08-02T17:16:01Z","timestamp":1375463761000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters"],"prefix":"10.1109","author":[{"given":"S.","family":"Devarakond","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Banerjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Banerjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Sen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.859570"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783755"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696192"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.46"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700603"},{"journal-title":"Practical Manufacturing Testing of 802 11OFDM Devices Litepoint","year":"0","key":"1"},{"key":"10","article-title":"DSP driven parallel evm testing of embedded mimo-ofdm rf modules (IMS3TW)","author":"devarakond","year":"0","journal-title":"2012 18th International"},{"key":"7","article-title":"A holistic approach to accurate tuning of rf systems for large and small multi-parameter perturbations","author":"natarajan","year":"0","journal-title":"VTS"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699225"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2024018"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.912144"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2005.849774"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139144"}],"event":{"name":"2013 18th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2013,5,27]]},"location":"Avignon, France","end":{"date-parts":[[2013,5,30]]}},"container-title":["2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6558538\/6569335\/06569363.pdf?arnumber=6569363","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T16:35:21Z","timestamp":1490200521000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6569363\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ets.2013.6569363","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}