{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:45:28Z","timestamp":1725432328985},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/ets.2013.6569364","type":"proceedings-article","created":{"date-parts":[[2013,8,2]],"date-time":"2013-08-02T21:16:01Z","timestamp":1375478161000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis"],"prefix":"10.1109","author":[{"given":"Fangming","family":"Ye","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhaobo","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2114681"},{"journal-title":"Independent Component Analysis","year":"2001","author":"oja","key":"17"},{"journal-title":"Elements of Information Theory","year":"2006","author":"cover","key":"18"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.159"},{"journal-title":"Statistical Pattern Recognition","year":"2003","author":"webb","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583975"},{"key":"14","article-title":"FPGA-based synthetic instrumentation for board test","author":"jutman","year":"2012","journal-title":"Proc ITC"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2234827"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401573"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437663"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-009-5108-8"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584042"},{"key":"1","article-title":"Design for board and system level structural test and diagnosis","author":"vo","year":"2006","journal-title":"Proc ITC"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583974"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2182984"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387332"},{"key":"5","first-page":"181","article-title":"Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?","author":"parker","year":"2003","journal-title":"Proc ITC"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5243-6"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/5326.971655"},{"key":"8","first-page":"1","article-title":"A model based automated debug process","author":"manley","year":"2002","journal-title":"IEEE Board Test Workshop"}],"event":{"name":"2013 18th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2013,5,27]]},"location":"Avignon, France","end":{"date-parts":[[2013,5,30]]}},"container-title":["2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6558538\/6569335\/06569364.pdf?arnumber=6569364","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:35:25Z","timestamp":1490214925000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6569364\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ets.2013.6569364","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}