{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:13:52Z","timestamp":1729610032600,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/ets.2013.6569366","type":"proceedings-article","created":{"date-parts":[[2013,8,2]],"date-time":"2013-08-02T21:16:01Z","timestamp":1375478161000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Extracting device-parameter variations using a single sensitivity-configurable ring oscillator"],"prefix":"10.1109","author":[{"given":"Yuma","family":"Higuchi","sequence":"first","affiliation":[]},{"given":"Ken-ichi","family":"Shinkai","sequence":"additional","affiliation":[]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[]},{"given":"Rahul","family":"Rao","sequence":"additional","affiliation":[]},{"given":"Sani","family":"Nassif","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"crossref","first-page":"1433","DOI":"10.1109\/JSSC.1989.572629","article-title":"Matching properties of MOS transistors","volume":"24","author":"pelgrom","year":"1989","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"journal-title":"Spectre Circuit Simulator Cadence Design Systems","year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2003.1334"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","key":"12"},{"key":"3","first-page":"1396","article-title":"Adaptive body bias for reducing impacts of dieto-die and within-die parameter variations on microprocessor frequency and leakage","volume":"37","author":"tschanz","year":"2002","journal-title":"IEEE JSSC"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/774572.774678"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568738"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/BF01400115"},{"key":"7","article-title":"Ring oscillators for single process-parameter monitoring","author":"wan","year":"2008","journal-title":"Proc Workshop on Test Structure Design for Variability Characterization"},{"key":"6","first-page":"83","article-title":"Process-sensitive monitor circuits for estimation of die-to-die process variability","author":"mahfuzul","year":"2010","journal-title":"Proc TAU"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2015789"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2006.1614281"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E94.A.2537"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722274"}],"event":{"name":"2013 18th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2013,5,27]]},"location":"Avignon, France","end":{"date-parts":[[2013,5,30]]}},"container-title":["2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6558538\/6569335\/06569366.pdf?arnumber=6569366","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T17:19:16Z","timestamp":1498065556000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6569366\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ets.2013.6569366","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}